Dielectric properties of ⟨001⟩-oriented Ba0.6Sr0.4TiO3 thin films on polycrystalline metal tapes using biaxially oriented MgO∕γ-Al2O3 buffer layers

Choi, Woong; Kang, Byunghoon; Jia, Q. X.; Matias, Vladimir; Findikoğlu, Alp T.

doi:10.1063/1.2173232

Cited by 19 publications

(9 citation statements)

References 17 publications

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“…Both of the BST films exhibited clear hysteresis (butterfly curves) in the ɛ r with dc bias, indicating the presence of permanent dipoles. Tunability is defined as (ɛ r,max −ɛ r,min )/ɛ r,max , which is known to depend on the degree of orientation 16 . The (111)‐oriented BST film grown with OMR=30% exhibited a remarkably tunability of 68%, as compared with 52% obtained with the highly (001)‐oriented BST film, at an applied field of ±400 kV/cm.…”

Section: Resultsmentioning

confidence: 99%

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO₃ Thin Films Sputtered on Pt/TiO_x/SiO₂/Si Without Buffer Layers

Yang

Wang

Dong

et al. 2010

Journal of the American Ceramic Society

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We report the growth of (001)‐ and (111)‐oriented (Ba,Sr)TiO3 (BST) films on Pt/TiOx/SiO2/Si substrates by RF magnetron sputtering without buffer layers. Interestingly, it was observed that the crystallographic orientation of prepared films strongly depended on O2/(Ar+O2) mixed ratios (OMR) during deposition. The samples with OMR=0% showed a perfect (001) orientation, while those with OMR ranging from 10% to 50% showed a preferential (111) orientation. The perfectly (111)‐oriented BST film deposited with OMR=30% exhibited a broader grain size distribution than the (001) textured BST film. At ±400 kV/cm, high tunability of 52% and 68% can be achieved for (001)‐ and (111)‐oriented BST films, respectively.

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Section: Resultsmentioning

confidence: 99%

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO₃ Thin Films Sputtered on Pt/TiO_x/SiO₂/Si Without Buffer Layers

Yang

Wang

Dong

et al. 2010

Journal of the American Ceramic Society

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“…The IBAD technique has been used with great effect to integrate single‐crystal‐like thin films of several different material systems with arbitrary smooth substrates; the prime example being high‐temperature superconducting wires . Researchers have used this technique to produce highly (001) oriented Ba 0.6 Sr 0.4 TiO 3 films on various substrates with excellent dielectric tunability/loss ratios for frequency agile devices . IBAD‐MgO has also been applied to amorphous Si 3 N 4 substrates for integration of Ba x Pb 1 − x TiO 3 thin films .…”

Section: Introductionmentioning

confidence: 99%

Epitaxial Pb(Zr,Ti)O₃ Thin Films on Flexible Substrates

Shelton

Gibbons

2011

Journal of the American Ceramic Society

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It is well known that the piezoelectric properties of a thin film can be influenced by crystallographic texture. At the extreme case, epitaxial thin films can be deposited on single crystal substrates (with appropriate lattice matching) to effectively achieve a single crystal thin film. Here, the maximum advantage of orientation dependence is found. Typically this has required small, expensive single crystalline substrates. In the past 10 years, however, the technique of ion beam assisted deposition has been developed for applying a biaxially textured template to an arbitrary smooth surface. This has opened up a new realm of materials integration possibilities, with the prime example being high-temperature superconducting wires. Here, the same template is utilized for deposition of epitaxial Pb(Zr,Ti)O 3 thin films onto LaNiO 3 and La 0.7 Sr 0.3 MnO 3 -coated flexible substrates. Chemical solution deposition (CSD) is used to produce PZT thin films with very high (00l) orientation and excellent in-plane orientation. Macroscopic ferroelectric measurements depict very square hysteresis behavior, with high remnant polarization of~40 lC/cm 2 . Piezoresponse force microscopy and local hysteresis measurements were used to image the microscopic domain structure and to demonstrate the piezoelectric behavior in these materials.

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“…Additionally, few reports on IBAD-MgO have been made for ferroelectrics or functional oxides other than HTS [16][17][18]. The perfection of crystallization (i.e., mosaic spread, in-plane alignment, out-of-plane orientation, and surface roughness) still requires intense study.…”

Section: A Texturing Mechanismmentioning

confidence: 99%

IBAD-MgO technology for coated conductors

Jo¹

2016

Progress in Superconductivity and Cryogenics

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Ion-beam assisted deposition (IBAD) technology has been successfully applied to high-temperature superconductor coated conductors (CC) as textured substrates. Since the coated conductors were proposed as a potential framework for utilizing the superior transport characteristics of YBa 2 Cu 3 O 7 and related cuprate oxides, several methods including rolling-assisted bi-axial textured substrates (RABiTS) and inclined substrate deposition (ISD), as well as IBAD, have been attempted. As of 2016, most companies that are trying to commercialize CC adapt IBAD technology except for American Superconductors who use RABiTS predominantly. For the materials in the IBAD process, initial efforts to use yttria-stabilized zirconia (YSZ) or related fluorites in Fujikura in Japan have quickly given way to MgO which technique was developed by Stanford University in the USA. In this review, we present a historical overview of IBAD technology, in particular, for the application of CC. We describe the key scientific understanding of nucleation, the texturing mechanism, and the growth of large bi-axial grains and discuss some potential new IBAD materials and systems for large-scale production.

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Dielectric properties of ⟨001⟩-oriented Ba0.6Sr0.4TiO3 thin films on polycrystalline metal tapes using biaxially oriented MgO∕γ-Al2O3 buffer layers

Cited by 19 publications

References 17 publications

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO₃ Thin Films Sputtered on Pt/TiO_x/SiO₂/Si Without Buffer Layers

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO₃ Thin Films Sputtered on Pt/TiO_x/SiO₂/Si Without Buffer Layers

Epitaxial Pb(Zr,Ti)O₃ Thin Films on Flexible Substrates

IBAD-MgO technology for coated conductors

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Dielectric properties of ⟨001⟩-oriented Ba0.6Sr0.4TiO3 thin films on polycrystalline metal tapes using biaxially oriented MgO∕γ-Al2O3 buffer layers

Cited by 19 publications

References 17 publications

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO3 Thin Films Sputtered on Pt/TiOx/SiO2/Si Without Buffer Layers

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO3 Thin Films Sputtered on Pt/TiOx/SiO2/Si Without Buffer Layers

Epitaxial Pb(Zr,Ti)O3 Thin Films on Flexible Substrates

IBAD-MgO technology for coated conductors

Contact Info

Product

Resources

About

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO₃ Thin Films Sputtered on Pt/TiO_x/SiO₂/Si Without Buffer Layers

Perfectly (001)‐ and (111)‐Oriented (Ba,Sr)TiO₃ Thin Films Sputtered on Pt/TiO_x/SiO₂/Si Without Buffer Layers

Epitaxial Pb(Zr,Ti)O₃ Thin Films on Flexible Substrates