2011
DOI: 10.1063/1.3527900
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Dielectric properties of NaNbO3:SrTiO3 interface nanolayer

Abstract: NaNbO 3 : SrTiO 3 interface nanolayers are studied by combining first-principles modeling and experimental approach. The nature of NaNbO 3 : SrTiO 3 interface is investigated using density-functional theory calculations. Interface parameters are experimentally estimated using analysis of the dielectric response of SrTiO 3 and NaNbO 3 epitaxial films and NaNbO 3 : SrTiO 3 superlattices. It is shown that NaNbO 3 : SrTiO 3 interfaces can be approximated by dielectric nanolayers with thickness 1-2 nm and with temp… Show more

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“…Such measurements under applied bias are even more challenging. Several groups have conducted electrical measurement on these systems 9,11,12 but they do not directly probe the microscopic interfacial electronic structure. X-ray photoelectron spectroscopy (XPS) can reveal the electronic structure.…”
Section: Introductionmentioning
confidence: 99%
“…Such measurements under applied bias are even more challenging. Several groups have conducted electrical measurement on these systems 9,11,12 but they do not directly probe the microscopic interfacial electronic structure. X-ray photoelectron spectroscopy (XPS) can reveal the electronic structure.…”
Section: Introductionmentioning
confidence: 99%