2007
DOI: 10.1063/1.2422738
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Dielectric property of particles at interface in random sequential adsorption and its application to whispering gallery mode resonance-shift sensors

Abstract: Dielectric properties of particles adsorbed onto a planar interface between two dielectric media are considered, taking into account the dipolar fields created by polarization induced in nearby particles as well as by their image dipoles. The use of a dipolar approximation allowed us to derive a self-consistent expression for the effective field experienced by each particle. The expression uses the pair correlation function of the particle distribution and is presented in a close form for normal and tangential… Show more

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Cited by 11 publications
(10 citation statements)
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“…We are preparing a manuscript for the TE and TM shifts that take into account the dipolar fields by neighboring particles explicitly at different surface densities of the particles. 17…”
Section: Discussionmentioning
confidence: 99%
“…We are preparing a manuscript for the TE and TM shifts that take into account the dipolar fields by neighboring particles explicitly at different surface densities of the particles. 17…”
Section: Discussionmentioning
confidence: 99%
“…The magnitude of the downward and upward swings is greater for a layer of a higher RI. The initial decrease in the ratio parallels the decrease of the shift ratio in adsorption of spherical particles to form a layer; 18 The shift ratio decreases with an increasing surface density of adsorbed particles, especially when the RI of the particles is high. It is interesting to note that at particular values of t, the ratio is equal to unity.…”
Section: ͑21͒mentioning
confidence: 96%
“…More detailed discussions about first order perturbation theory for obtaining the shift can be found in [41,42]. One can assume that the field of a particular biomolecule is not influenced by its neighbors [43] and take into account that the lowest surface density that can be detected depends on the resonance line width δλ (or a fraction F of the linewidth), which in turn depends on the quality factor Q = λ/δλ [11]. Accordingly, the LOD of surface density may be given by [11,21]: σitalicLOD=ε0R0 (Ns2Nm2)FαitalicexQ…”
Section: General Principles: Recognition Elements Reactive Mechanismmentioning
confidence: 99%