2006
DOI: 10.1016/j.jallcom.2005.11.024
|View full text |Cite
|
Sign up to set email alerts
|

Dielectric relaxation property and barrier layer formation in CrNbO4 oxides

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
10
0

Year Published

2009
2009
2024
2024

Publication Types

Select...
9

Relationship

2
7

Authors

Journals

citations
Cited by 24 publications
(10 citation statements)
references
References 18 publications
0
10
0
Order By: Relevance
“…The relaxation time of polarized materials is very short (10 À 11 s). At higher frequencies the orientations cannot follow the alternating field and thus dielectric parameters become constants [14,[32][33].…”
Section: Dielectric Parametersmentioning
confidence: 99%
“…The relaxation time of polarized materials is very short (10 À 11 s). At higher frequencies the orientations cannot follow the alternating field and thus dielectric parameters become constants [14,[32][33].…”
Section: Dielectric Parametersmentioning
confidence: 99%
“…Hsiao). material consisting of grains which become semiconducting while grain boundaries are insulating [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…In addition, the curve warps upwards at high temperature due to the influence of leakage conductivity [16], which is produced by a migration of Na + or oxygen vacancies at a high temperature. This phenomenon may be caused by the interfacial orientation and space charge polarizations effect [14,17], leading the dielectric constant to increase at high temperature. These dipoles may change their orientation due to the jumping of oxygen ions through vacant oxygen sites.…”
Section: Temperature Dependences Of the Dielectric Constantmentioning
confidence: 99%