1987
DOI: 10.1103/physrevb.35.6570
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Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy

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Cited by 295 publications
(172 citation statements)
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“…Under quite general assumptions, the (single inelastic scattering) energy loss function (ELF) corresponding to the bulk target (i.e., avoiding surface effect contributions) can be extracted from these experimental data using a procedure described in ref 27. Figure 1b shows the ELF of Ta 2 O 5 derived from the REELS measurements presented in the upper panel.…”
Section: Electronic Excitation Spectrum Ofmentioning
confidence: 99%
“…Under quite general assumptions, the (single inelastic scattering) energy loss function (ELF) corresponding to the bulk target (i.e., avoiding surface effect contributions) can be extracted from these experimental data using a procedure described in ref 27. Figure 1b shows the ELF of Ta 2 O 5 derived from the REELS measurements presented in the upper panel.…”
Section: Electronic Excitation Spectrum Ofmentioning
confidence: 99%
“…However, quantitative interpretation of the experimental results is not straightforward since inside the solid, the electrons experience intensive multiple scattering implying that experimental data need to be deconvoluted before information on the dielectric response of the solid can be extracted from them. In the past, the algorithm of Tougaard and Chorkendorff (hereafter designated by "TC") [11] has been frequently used for this purpose. However, it has recently been shown [12,13] that the loss distribution retrieved by the TC-algorithm is not unique, i.e., it constitutes a not very well defined mixture of so-called surface and volume electronic excitations of any scattering order, which makes quantitative interpretation and extraction of the dielectric function troublesome.…”
mentioning
confidence: 99%
“…al. [13,16,18,[20][21][22][23][24][25] have employed the semi-classical dielectric response model proposed by Tougaard and Yubero [26][27][28][29] in their calculation of ELF. The algorithms of this method have been implemented in the generally available QUEELS-(k,)-REELS software package [29].…”
Section: Experimental Methodsmentioning
confidence: 99%
“…REELS is surface sensitive and the spectra carries information on the electronic structure of the material because the energy loss experienced by the incident electron depends on the electronic structure of the material. The spectra can easily be recorded over a wide energy-loss range [13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28][29]. The calculation of the ELFs of zirconium oxide, silicon dioxide, and zirconium silicates from REELS spectra has already been performed by Tahir et.…”
mentioning
confidence: 99%