Differential phase contrast 2.0—Opening new “fields” for an established technique

Lohr, Matthias; Schregle, Ralph; Jetter, Michael; Wächter, Clemens; Wunderer, Thomas; Scholz, F.; Zweck, Josef

doi:10.1016/j.ultramic.2012.03.020

Cited by 95 publications

(75 citation statements)

References 23 publications

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“…The detailed description of DPC principles can be found elsewhere [24][25][26][27][28][29]. The main idea of conventional DPC with a dark field four-quadrant detector is illustrated in Fig.1a A typical unitary detector in a conventional TEM system, however, is not flexible to shift around routinely (only "in" and "out" hardware fixed positions).…”

Section: The Main Idea: Lm-stem Dpc and A Unitary Detectormentioning

confidence: 99%

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Multiscale differential phase contrast analysis with a unitary detector

2016

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Chuvilin, Multiscale differential phase contrast analysis with a unitary detector, Ultramicroscopy, http://dx.doi.org/10. 1016/j.ultramic.2015.12.008 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting galley proof before it is published in its final citable form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.

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Section: The Main Idea: Lm-stem Dpc and A Unitary Detectormentioning

confidence: 99%

“…Several methods within TEM such as Lorenz microscopy [18][19][20], Electron Holography [21][22][23] (EH) and Differential Phase Contrast [24][25][26][27][28][29] (DPC)…”

Section: Introductionmentioning

confidence: 99%

Multiscale differential phase contrast analysis with a unitary detector

2016

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“…The methodology is demonstrated using realistic simulations and may help designing the next generation of STEM detectors, where a greater flexibility in the choice of detector areas is provided. 29,30 In conclusion, the proposed method can be applied to a wide range of materials applications and will provide objective suggestions for the inner and outer angle of the annular STEM detector in order to detect specific atoms with the lowest probability of error. Obviously, the present analysis can easily be extended to include other microscope settings including convergence angle, defocus, and spherical aberration.…”

Section: Fig 2 Pmentioning

confidence: 99%

Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

Gonnissen

Backer

Dekker

et al. 2014

Applied Physics Letters

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We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of technologically important materials, we demonstrate the benefits of the proposed method and compare the results with existing approaches. V C 2014 AIP Publishing LLC. [http://dx

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“…However, these imaging modes offer quantitative information on the sample, mostly at the level of confirming the general structure and perhaps counting the number of atoms (for example, that half the S atoms were missing in the MoS 2 case). By contrast, under certain conditions quantitative DPC can be used to map the full electric and magnetic field distributions within materials, from the micron scale down to atomic resolution [6,[29][30][31]32]. Using the full 2D diffraction patterns, the first moment or center of mass for each probe position along two perpendicular directions can be calculated via [6,32,33]:…”

Section: Quantitative Dpc Imagesmentioning

confidence: 99%

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

et al. 2016

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a b s t r a c tFour-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full twodimensional convergent beam electron diffraction (CBED) pattern is acquired at every STEM pixel scanned. Capturing the full diffraction pattern provides a rich dataset that potentially contains more information about the specimen than is contained in conventional imaging modes using conventional integrating detectors. Using 4D datasets in STEM from two specimens, monolayer MoS 2 and bulk SrTiO 3 , we demonstrate multiple STEM imaging modes on a quantitative absolute intensity scale, including phase reconstruction of the transmission function via differential phase contrast imaging. Practical issues about sampling (i.e. number of detector pixels), signal-to-noise enhancement and data reduction of large 4D-STEM datasets are emphasized.

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Differential phase contrast 2.0—Opening new “fields” for an established technique

Cited by 95 publications

References 23 publications

Multiscale differential phase contrast analysis with a unitary detector

Multiscale differential phase contrast analysis with a unitary detector

Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

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