Differential scanning calorimetric studies on As–Te–Si glasses: Network topological effects and the composition dependence of thermal parameters

Anbarasu, M.; Asokan, S.

doi:10.1016/j.jnoncrysol.2006.02.024

Journal of Non-Crystalline Solids

2006

DOI: 10.1016/j.jnoncrysol.2006.02.024

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Differential scanning calorimetric studies on As–Te–Si glasses: Network topological effects and the composition dependence of thermal parameters

M. Anbarasu

S. Asokan

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2008

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High pressure studies on the electrical resistivity of As–Te–bond Si glasses and the effect of network topological thresholds

Verma¹,

Sharmila

Rukmani

et al. 2008

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The variation of resistivity in an amorphous As 30 Te 70−x Si x system of glasses with high pressure has been studied for pressures up to 8 GPa. It is found that the electrical resistivity and the conduction activation energy decrease continuously with increase in pressure, and samples become metallic in the pressure range 1.0-2.0 GPa. Temperature variation studies carried out at a pressure of 0.92 GPa show that the activation energies lie in the range 0.16-0.18 eV. Studies on the composition/average co-ordination number r dependence of normalized electrical resistivity at different pressures indicate that rigidity percolation is extended, the onset of the intermediate phase is around r = 2.44, and completion at r = 2.56, respectively, while the chemical threshold is at r = 2.67. These results compare favorably with those obtained from electrical switching and differential scanning calorimetric studies.

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High pressure studies on the electrical resistivity of As–Te–bond Si glasses and the effect of network topological thresholds

Verma¹,

Sharmila

Rukmani

et al. 2008

High Pressure Research

Self Cite

View full text Add to dashboard Cite

show abstract

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Differential scanning calorimetric studies on As–Te–Si glasses: Network topological effects and the composition dependence of thermal parameters

Cited by 1 publication

References 13 publications

High pressure studies on the electrical resistivity of As–Te–bond Si glasses and the effect of network topological thresholds

High pressure studies on the electrical resistivity of As–Te–bond Si glasses and the effect of network topological thresholds

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