2014
DOI: 10.1002/sia.5665
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Differentially pumped quadrupole SIMS probe on FIB‐based and two‐beam microscopes

Abstract: Two microscopes with focused ion beam (FIB) columns in the Department of Materials, Imperial College, have been fitted with SIMS probes (Hiden EQS 1000). Both probes have differential pumping to maintain the vacuum in the probe below 5 × 10 À6 mbar irrespective of the main operating and imaging conditions of the microscopes. In both microscopes, standard operations include the injection of oxygen-containing species close to the sputter site. This process is also a technique for SIMS analysis instrumentation to… Show more

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Cited by 4 publications
(2 citation statements)
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“…A single beam gallium ion microscope, FEI FIB200 workstation 11 with a quadrupole-based SIMS detector has been fitted with a second SIMS detector, a Hiden EQS 1000, 12 which is also quadrupole-based but is separately and differentially pumped. 9 The relative orientation of the detectors is shown in Fig. 1 with respect to the impact point of the primary ion beam on the sample target.…”
Section: Instrument Configurationmentioning
confidence: 99%
“…A single beam gallium ion microscope, FEI FIB200 workstation 11 with a quadrupole-based SIMS detector has been fitted with a second SIMS detector, a Hiden EQS 1000, 12 which is also quadrupole-based but is separately and differentially pumped. 9 The relative orientation of the detectors is shown in Fig. 1 with respect to the impact point of the primary ion beam on the sample target.…”
Section: Instrument Configurationmentioning
confidence: 99%
“…Innovatively, the system was operated such that positive and negative sputtered ions could be detected simultaneously -the former by a FEI FIB200-SIMS detector, the latter by a Hiden EQS1000 system [11,28].…”
Section: Focussed Ion-beam With Secondary Ion Mass Spectrometry (Fib-mentioning
confidence: 99%