2022
DOI: 10.3390/jimaging8080206
|View full text |Cite
|
Sign up to set email alerts
|

Diffraction Enhanced Imaging Analysis with Pseudo-Voigt Fit Function

Abstract: Diffraction enhanced imaging (DEI) is an advanced digital radiographic imaging technique employing the refraction of X-rays to contrast internal interfaces. This study aims to qualitatively and quantitatively evaluate images acquired using this technique and to assess how different fitting functions to the typical rocking curves (RCs) influence the quality of the images. RCs are obtained for every image pixel. This allows the separate determination of the absorption and the refraction properties of the materia… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
6

Relationship

3
3

Authors

Journals

citations
Cited by 8 publications
(4 citation statements)
references
References 32 publications
0
4
0
Order By: Relevance
“…where D sch is crystallite size, K is the shape factor which equals 0.89, λ is the wavelength of Cu-Kα radiation (λ = 1.5406 Å), b hkl is the full-width at half-maximum (FWHM) of the prominent peak where the value was obtained from Gaussian fitting function, and θ is the diffraction angle [38,39]. The calculated crystallite size of all samples is summarized in table 1.…”
Section: Resultsmentioning
confidence: 99%
“…where D sch is crystallite size, K is the shape factor which equals 0.89, λ is the wavelength of Cu-Kα radiation (λ = 1.5406 Å), b hkl is the full-width at half-maximum (FWHM) of the prominent peak where the value was obtained from Gaussian fitting function, and θ is the diffraction angle [38,39]. The calculated crystallite size of all samples is summarized in table 1.…”
Section: Resultsmentioning
confidence: 99%
“…Using an in‐house developed Python 3.0‐based software, the rocking curve is fit by a pseudo‐Voigt function for each detector pixel. [ 45 ] The curve parameters I 0 (curve integral without specimen in the beam), I (curve integral with specimen in the beam), I R0 (the curve maximum without specimen in the beam), and I R (curve maximum with specimen in the beam) are determined from the fitting and saved as gray value 2D images. Using the image analysis software “Fiji Image J”, [ 46 ] the local attenuation properties μ · t and the local refraction values C m · t can be evaluated for each pixel according to Equation () and (), respectively.…”
Section: Synchrotron X‐ray Refraction Radiography (Sxrr)mentioning
confidence: 99%
“…Relative to the intrinsic RC (without specimen), specimens having internal interfaces dampen the RC's peak height and broaden its width significantly (and possibly shift its center). These parameters were evaluated using an in‐house software code 29 based on Python. For example, for the VF specimen, the full width half maximum of about 0.00094° of the intrinsic RC was increased to 0.00214°.…”
Section: Experimental Techniquesmentioning
confidence: 99%