Diffraction grating transmission efficiencies for XUV and soft x rays

Schnopper, H. W.; Speybroeck, Leon P. Van; Delvaille, J. P.; Epstein, Ariel; Källne, E.; Bachrach, R. Z.; Dijkstra, J. H.; Lantward, L.

doi:10.1364/ao.16.001088

Cited by 117 publications

(47 citation statements)

References 6 publications

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“…In order for the efficiency of the even orders, greater than the m=0 order, of a transmission grating to go to zero at x-ray wavelengths, the width of the slits must be half of the grating pitch. 7,8 In addition for the efficiency of the m=0 order of the grating to go to zero, there must be negligible absorption and the bar structure of the grating must produce a shift of  radians relative to the slits of the grating. 7,8 Light elements can easily be made to provide the desired  phase shift and yet not provide any significant absorption of the x rays.…”

Section: Grating Design At 10 Kev For the Two-dimensional X-ray Shearmentioning

confidence: 99%

Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer

Baker

2010

SPIE Proceedings

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This article presents the design and simulated performance of a two-dimensional x-ray shearing interferometer wavefront sensor. In particular, this phase sensitive x-ray wavefront sensor is evaluated for its ability to perform metrology on the DT ice layer in an inertial confinement fusion capsule. The interferometer uses crossed phase gratings in a single plane and is capable of operation over a wide range of x-ray energies by varying the grating material and thickness. The wave-front sensor is insensitive to vibrations and, unlike X-RayTalbot interferometers, recovers the full two-dimensional phase profile of the x-ray beam rather than the gradient in only one dimension.

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Section: Grating Design At 10 Kev For the Two-dimensional X-ray Shearmentioning

confidence: 99%

Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer

Baker

2010

SPIE Proceedings

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“…We have already described the experimental procedure we have developed using the soft X-ray (4 ° ) beam line at the Stanford Synchrotron Radiation Laboratory [1,2]. The transmission grating tests have proven useful in the measurement of the diffraction efficiencies of the transmission gratings as well as in the analysis of the composition of the synchrotron radiation beam from the grazing incidence monochromator ("The Grasshopper") [6].…”

Section: Diffraction Efficiency Measurementsmentioning

confidence: 99%

“…At normal incidence the diffracted intensity distribution is modelled as described in our earlier paper [1]. The model neglects multiple scattering as well as any kind of edge effects (e.g., small angle scattering) in the grating wires.…”

Section: Modelling Of the Gratingsmentioning

confidence: 99%

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Diffraction efficiencies of holographic transmission gratings in the region 80–1300 eV

Delvaille

Schnopper

Källne

et al. 1980

Nuclear Instruments and Methods

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Experimental measurements of diffraction efficiencies for holographic transmission gratings have been performed. The transmitted intensity distribution is characterized by an overall efficiency of about 10% into first order and a strong resonance enhancement, up to 20% efficiency, around the region of anomalous dispersion. The intensity distribution is well described by a grating model which predicts the overall efficiency, as well as the detailed behavior of the grating around the regions of anomalous dispersion. The model can be used to predict the efficiencies for an arbitrary grating material and thickness, and thus aid in the determination of grating structure for a specific experimental application.

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“…Indeed, for a lamellar ML grating, the geometrical term can differ from that of a convectional grating. 13 For an ideal lamellar grating with significantly large number of bilayers (with no absorption), there should not be any geometrical losses. In this case, the maximum intensity, diffracted in high order, would be reached at infinitively small size of the grating lands, corresponding to the first maximum of sinc function in (2).…”

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Development of an ultrahigh-resolution diffraction grating for soft x-rays

Voronov

Cambie

Feshchenko³

et al. 2007

SPIE Proceedings

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Resonant Inelastic X-ray Scattering (RIXS) is the one of the most powerful methods for investigation of the electronic structure of materials, specifically of excitations in correlated electron systems. However the potential of the RIXS technique has not been fully exploited because conventional grating spectrometers have not been capable of achieving the extreme resolving powers that RIXS can utilize. State of the art spectrometers in the soft x-ray energy range achieve ~0.25 eV resolution, compared to the energy scales of soft excitations and superconducting gap openings down to a few meV. Development of diffraction gratings with super high resolving power is necessary to solve this problem. In this paper we study the possibilities of fabrication of gratings of resolving power of up to 10 6 for the 0.5 -1.5 KeV energy range. This energy range corresponds to all or most of the useful dipole transitions for elements of interest in most correlated electronic systems, i.e. oxygen K-edge of relevance to all oxides, the transition metal L 2,3 edges, and the M 4,5 edges of the rare earths. Various approaches based on different kinds of diffraction gratings such as deep-etched multilayer gratings, and multilayer coated echelettes are discussed. We also present simulations of diffraction efficiency for such gratings, and investigate the necessary fabrication tolerances.

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Diffraction grating transmission efficiencies for XUV and soft x rays

Cited by 117 publications

References 6 publications

Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer

Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer

Diffraction efficiencies of holographic transmission gratings in the region 80–1300 eV

Development of an ultrahigh-resolution diffraction grating for soft x-rays

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