2001
DOI: 10.1007/bf02665858
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Diffusion length measurements in p-HgCdTe using laser beam induced current

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Cited by 27 publications
(10 citation statements)
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“…This suggests minority-carrier-diffusion lengths at 300 K on the order of 20 μm (n-type with N D = 5 × 10 15 cm −3 ) and 100 μm (p-type with N A = 5 × 10 15 cm −3 ). These estimates are consistent with the reported SWIR HgCdTe diffusion lengths [16], [17]. As a result, even with low Shockley-Read-Hall (SRH) lifetimes on the order of τ SRH = 10 μs, DLPH HgCdTe arrays at 10-, 15-, and 20-μm pitch (center-to-center separation) with implant r 0 = 2 μm satisfy the dense array conditions.…”
Section: Device Architecture and Materials Modelsupporting
confidence: 87%
“…This suggests minority-carrier-diffusion lengths at 300 K on the order of 20 μm (n-type with N D = 5 × 10 15 cm −3 ) and 100 μm (p-type with N A = 5 × 10 15 cm −3 ). These estimates are consistent with the reported SWIR HgCdTe diffusion lengths [16], [17]. As a result, even with low Shockley-Read-Hall (SRH) lifetimes on the order of τ SRH = 10 μs, DLPH HgCdTe arrays at 10-, 15-, and 20-μm pitch (center-to-center separation) with implant r 0 = 2 μm satisfy the dense array conditions.…”
Section: Device Architecture and Materials Modelsupporting
confidence: 87%
“…When published values for the carrier mobility [9] were used in Equations (19) and (17) to solve for the diffusion length, the resulting values did not match measured results [10].…”
Section: Dark Currentmentioning
confidence: 91%
“…These estimates are consistent with reported, albeit widely varying, SWIR HgCdTe diffusion lengths. 12,13 As a result, DLPH HgCdTe arrays at 10 lm, 15 lm, and 20 lm pitch (center-tocenter separation) with implant r 0 = 2 lm should satisfy the dense array conditions for intrinsically limited lifetimes. Table II summarizes various bulk material parameters used in the device model based on the foregoing analytic models, using a conservative |F 1 F 2 | = 0.20.…”
Section: Materials Modelmentioning
confidence: 98%