Digital holographic measurement system for use on multi-axis systems

Stevanovic, Jonas; Seyler, Tobias; Aslan, J.; Beckmann, Tobias; Bertz, Alexander; Carl, Daniel

doi:10.1117/12.2592370

Cited by 6 publications

(3 citation statements)

References 14 publications

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“…The holographic sensor design shall not be discussed in detail in this article -it has already been published in previous articles 17,19,20 . Nevertheless, a short description of the relevant hardware components and features is given: The sensor is mechanically mounted using the machine's HSK-A63 tool interface.…”

Section: Machine Tool and Digital Holographic Sensormentioning

confidence: 99%

Digital holography in a machine tool: measuring large-scale objects with micron accuracy

Seyler

Fratz

Schiller

et al. 2023

Optical Measurement Systems for Industrial Inspection XIII

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We present digital multi-wavelength holography measurements generated inside a machine tool. The digital holographic sensor HoloTop NX used in the application has a field of view of 12.5 mm × 12.5 mm, each field of view consists of 3008 px × 3008 px. Three separately stabilized diode lasers connected to a fiber switch serve as light sources. The unambiguous measurement range of the holographic sensor defined by the laser wavelengths is approximately 140 µm and the axial reproducibility is ~0.4 µm. The sensor is mounted to a standard 5-axis machine tool Hermle C 32U. An automatically created numerical control (NC) program enables the machine tool to meander the sensor over larger test objects, here 280 mm × 94 mm. For each field of view, a height map with 9 million data points is generated using digital holography. The images are acquired with 2 mm lateral overlap and are then stitched together to achieve a height map of the complete sample with more than 1.4 billion data points. For comparison the shape of the sample was measured with a state-of-the-art coordinate measurement machine (CMM). The datasets from the CMM and the holographic measurement are semi-automatically referenced to each other. The holographic height data are averaged over a rectangular area with radius 50 µm around each of the 360 measurement locations where the tactile CMM measurement data have been acquired. This allows us to evaluate deviations between the holographic and the CMM dataset. It turns out that the root mean square (RMS) error between the two data sets is smaller than 0.4 µm.

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Section: Machine Tool and Digital Holographic Sensormentioning

confidence: 99%

Digital holography in a machine tool: measuring large-scale objects with micron accuracy

Seyler

Fratz

Schiller

et al. 2023

Optical Measurement Systems for Industrial Inspection XIII

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“…1 It can meet the requirements of industrial use cases concerning fast production cycles, accuracy and repeatability, and provides the robustness for practical applications such as measurements directly in machining tools 2 or using other multi-axis systems. 3 Since its first introduction in the 1990s 4 and its first adaption in industrial applications, 1 the usage of DH has turned towards various new measurement tasks, which has also created new challenges. These challenges will become clear by contrasting conventional laboratory configurations with those encountered in industrial applications.…”

Section: Introductionmentioning

confidence: 99%

On the influence of schlieren in large field-of-view applications of multiwavelength holography

Aslan,

Seyler,

Leclerc

et al. 2024

Practical Holography XXXVIII: Displays, Materials, and Applications

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High-precision applications of multiwavelength holography typically requires stable laboratory-like environments, which is hard to achieve in industrial applications. The influence of schlieren is crucial, especially in large fieldof-view applications, where long working distances can result in optical paths up to one meter. Schlieren is a well-known effect in interferometry and can be seen in the reconstructed object wavefronts. Small perturbations in temperature change the refractive index of air resulting in local variations of the optical path. Proper encapsulation or vacuum techniques are typically employed to compensate for this. In this work, we investigate the impact of schlieren on multiwavelength holography and propose a compensation method. The sensor used is a Mach-Zehnder-based interferometer with a field-of-view of 17.9 mm × 13.4 mm and a camera with 9344 px × 7000 px. A mirror was positioned at a distance of 1 m in front of the sensor. We performed holographic and interferometric measurements with and without an encapsulating pipe around the beam to investigate the influence of schlieren. The deviations of the phase shifts of the holographic data were laterally resolved using a modified version of the algorithm proposed by Cai et al. The fringe patterns of the interferometric data captured with different exposure times and frame rates were analyzed using a sinusoidal fit and discrete Fourier transformations (DFT) to show lateral frequency deviations. Both methods show that encapsulation leads to improved measurements. A potential compensation method is proposed.

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“…Die erfolgreiche Integration des digital-holographischen HoloTop-Sensors in eine Fertigungslinie für Präzisionsdrehteile zeigt die Eignung für die 100 %-Qualitätskontrolle bei einem Produktionstakt von einem Prüfling pro Sekunde. Jüngste Arbeiten zeigen sogar die Fähigkeit, holographische Sensorsysteme in Werkzeugmaschinen zu integrieren [3,5,6]. Der Prototyp HoloGear überträgt diese Erfahrungen nun auf die Verzahnungsmesstechnik und zeigt damit das enorme Potential für die Qualitätssicherung durch flächigenicht scannende -Messungen.…”

Section: Introductionunclassified

Flächige Zahnflankenprüfung mittels digitaler Holographie – optisch, schnell, präzise

Schiller¹,

Fratz²,

Seyler³

et al. 2021

Verzahnungsmesstechnik 2021

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KurzfassungDie Suche nach neuen Verzahnungsmessverfahren führt unweigerlich zu optischen Methoden: Diese Verfahren liefern hochpräzise Daten in kürzester Zeit und das nicht nur punktweise sondern flächig. Bisher scheitern optische Messungen in der Verzahnungsmessung jedoch an steilen Flanken und Mehrfachreflexionen. Wir zeigen am Beispiel eines prototypischen Systems wie diese Aspekte überwunden werden können, um Präzision und Geschwindigkeit in der Verzahnungsmessung zu kombinieren. Dabei wird die digitale Mehrwellenlängenholographie eingesetzt. Basierend auf dieser Technologie erfasst unser Inspektionssystem eine vollständige Zahnflanke in einer einzigen Aufnahme mit Millionen von 3D-Punkten und einer Genauigkeit von unter einem Mikrometer.

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Digital holographic measurement system for use on multi-axis systems

Cited by 6 publications

References 14 publications

Digital holography in a machine tool: measuring large-scale objects with micron accuracy

Digital holography in a machine tool: measuring large-scale objects with micron accuracy

On the influence of schlieren in large field-of-view applications of multiwavelength holography

Flächige Zahnflankenprüfung mittels digitaler Holographie – optisch, schnell, präzise

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