Digitally Controlled Absolute Voltage Division

Klaassen, K.B.

doi:10.1109/tim.1975.4314388

Cited by 34 publications

(12 citation statements)

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“…Error due to ∆ p can be reduced by dynamically interchanging the current sources in the bipolar core [15] using DEM [16]. This is illustrated for the case of the bipolar core in Figure 1.…”

Section: Sensor Operating Principles and Error Budgetingmentioning

confidence: 99%

A Low Power Energy-Efficient Precision CMOS Temperature Sensor †

Wei

Bao

2018

Micromachines

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This paper presents a low power, energy-efficient precision CMOS temperature sensor. The front-end circuit is based on bipolar junction transistors, and employs a pre-bias circuit and bipolar core. To reduce measurement errors arising from current ratio mismatch, a new dynamic element-matching mode is proposed, which dynamically matches all current sources in the front-end circuit. The first-order fitting and third-order fitting are used to calibrate the output results. On the basis of simulation results, the sensor achieves 3σ-inaccuracies of +0.18/−0.13 °C from −55 °C to +125 °C. Measurement results demonstrate sensor 3σ-inaccuracies of ±0.2 °C from 0 °C to +100 °C. The circuit is implemented in 0.18 μm CMOS, and consumes 6.1 μA with a 1.8 V supply voltage.

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Section: Sensor Operating Principles and Error Budgetingmentioning

confidence: 99%

A Low Power Energy-Efficient Precision CMOS Temperature Sensor †

Wei

Bao

2018

Micromachines

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“…In many I/O circuits, low-voltage core devices are often cascaded to interface with external high-voltages as shown in Fig. 7 [5]. This is another good application of aging models to help check that the core devices can sustain the possible over-stress.…”

Section: General Circuit Aging Simulation Flowmentioning

confidence: 99%

Circuit reliability simulation using TMI2

Jeng

Hsiao

et al. 2013

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference

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Using simulation to assess the impacts of various reliability mechanisms to circuit performance has become prevail for advanced technologies due to smaller headroom (=Vdd-Vth) and less design margins. This paper reviews existing circuit aging simulation approaches with focus on TMI. The limitations of aging models are also discussed so that reliability simulations can be executed more correctly with the right expectation. An example circuit under multi-waveform and multi-temperature stress is presented to illustrate reliability simulation flow through TMI.

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“…After samples, all capacitors have been used to sample . The total transferred charge amounts to (4) where represents a charge which is also transferred to the integrator during each sample. This charge is constant for every sample, independent of , even when the sampling capacitors have different values.…”

Section: Principles Of Operationmentioning

confidence: 99%

“…In [4], Klaassen proposed a method to increase the accuracy of voltage dividers by using the principle of dynamic element matching (DEM). The accuracy of the type of divider presented is limited by the mismatch of the switch ON resistance.…”

Section: Introductionmentioning

confidence: 99%

A simple accurate bridge-transducer interface with continuous autocalibration

Goes

Meijer

1997

IEEE Trans. Instrum. Meas.

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Abstract-This paper presents a one-chip simple and accurate transducer interface for resistive bridges. A key part of this interface is formed by a novel dynamic voltage divider. In this divider the bridge supply voltage is measured for reference purposes in small parts (piece-wise measurement) which are within the range of the bridge output voltage. The use of an autocalibration technique, the three-signal method, eliminates influence of linear parameters and errors. Moreover, the effects of the nonidealities of the applied switches are also eliminated. The circuit has been realized in a 3 m BiCMOS process and shows an uncertainty of only 10 V for a bridge supply voltage of 5 V.

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Digitally Controlled Absolute Voltage Division

Cited by 34 publications

References 0 publications

A Low Power Energy-Efficient Precision CMOS Temperature Sensor †

A Low Power Energy-Efficient Precision CMOS Temperature Sensor †

Circuit reliability simulation using TMI2

A simple accurate bridge-transducer interface with continuous autocalibration

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