1985
DOI: 10.1103/physrevlett.55.1765
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Direct imaging of a novel silicon surface reconstruction

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Cited by 145 publications
(36 citation statements)
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“…However, surface reconstruction phenomena for {1 1 3} faces are quite complex, and although some of these configurations could be validated in the case of silicon [14,15], no experimental evidence existed to date on the exact structure of these surfaces for diamond. Moreover, the presence of hydrogen on the surface, which is always present during CVD diamond processes, makes the evaluation of the different crystalline surface energies even more complicated.…”
Section: Article In Pressmentioning
confidence: 97%
“…However, surface reconstruction phenomena for {1 1 3} faces are quite complex, and although some of these configurations could be validated in the case of silicon [14,15], no experimental evidence existed to date on the exact structure of these surfaces for diamond. Moreover, the presence of hydrogen on the surface, which is always present during CVD diamond processes, makes the evaluation of the different crystalline surface energies even more complicated.…”
Section: Article In Pressmentioning
confidence: 97%
“…By introducing a goniometer with a built-in tilting mechanism in a specimen holder, crystalline specimens could be tilted around two independent rotational axes, and therefore, the structure images with the incident electron beam exactly parallel to a zone axis of a crystalline specimen could be observed [47]. Using the specimen tilting mechanism, structural analysis of crystalline specimens using high-resolution TEM was made possible on surfaces [48][49][50], grain boundaries [51][52][53], and extended defects [54][55][56]. In ETEM with a differential pumping aperture system, a large chamber around a specimen provides the mechanism for tilting a specimen around the independent rotational axes to observe structural images of a crystalline sample.…”
Section: An E-cell For Structure Imaging Of a Crystalline Specimenmentioning
confidence: 99%
“…Considering that high-resolution transmission electron microscopy (HRTEM) can provide real-space information about surface steps, terraces, and defects at atomic resolution, and it has been successfully applied in the study of surface reconstruction of many materials, such as CdTe and silicon [39][40][41], in this paper, we use HRTEM to study the reconstruction of clean ZnO surfaces formed in situ in TEM. By comparing the experimental images with simulated images based on the proposed models, the reconstruction and relaxation of surface atoms have been identified, providing direct evidence about the structural configuration of surface atoms.…”
Section: Introductionmentioning
confidence: 99%