Direct Nanoscale Imaging of Ballistic and Diffusive Thermal Transport in Graphene Nanostructures

Pumarol, M.; Rosamond, Mark C.; Tovee, Peter; Petty, Michael C.; Zeze, Dagou A.; Falko, Vladimir; Kolosov, Oleg

doi:10.1021/nl3004946

Cited by 90 publications

(133 citation statements)

References 39 publications

(103 reference statements)

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“…It was demonstrated elsewhere [4,6,[24][25][26] that the thermal properties of the tip apex have a major impact on the performance of the SThM probe. Therefore, this study focuses on the apex of the SThM probe (dashed square in the Fig.…”

Section: Analytical Model Of the Sthm Probementioning

confidence: 99%

Scanning thermal microscopy with heat conductive nanowire probes

et al. 2016

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(2016) 'Scanning thermal microscopy with heat conductive nanowire probes.', Ultramicroscopy., 162 . pp. 42-51.Further information on publisher's website:http://dx.doi.org/10. 1016/j.ultramic.2015.12.006 Publisher's copyright statement: Use policyThe full-text may be used and/or reproduced, and given to third parties in any format or medium, without prior permission or charge, for personal research or study, educational, or not-for-prot purposes provided that:• a full bibliographic reference is made to the original source • a link is made to the metadata record in DRO • the full-text is not changed in any way The full-text must not be sold in any format or medium without the formal permission of the copyright holders.Please consult the full DRO policy for further details. AbstractScanning thermal microscopy (SThM), which enables measurement of thermal transport and temperature distribution in devices and materials with nanoscale resolution is rapidly becoming a key approach in resolving heat dissipation problems in modern processors and assisting development of new thermoelectric materials. In SThM, the self-heating thermal sensor contacts the sample allowing studying of the temperature distribution and heat transport in nanoscaled materials and devices. The main factors that limit the resolution and sensitivities of SThM measurements are the low efficiency of thermal coupling and the lateral dimensions of the probed area of the surface studied. The thermal conductivity of the sample plays a key role in the sensitivity of SThM measurements. During the SThM measurements of the areas with higher thermal conductivity the heat flux via SThM probe is increased compared to the areas with lower thermal conductivity. For optimal SThM measurements of interfaces between low and high thermal conductivity materials, well defined nanoscale probes with high thermal conductivity at the probe apex are required to achieve a higher quality of the probe-sample thermal contact while preserving the lateral resolution of the system.In this paper, we consider a SThM approach that can help address these complex problems by using high thermal conductivity nanowires (NW) attached to a tip apex.We propose analytical models of such NW-SThM probes and analyse the influence of the contact resistance between the SThM probe and the sample studied. The latter becomes particularly important when both tip and sample surface have high thermal conductivities.2 These models were complemented by finite element analysis simulations and experimental tests using prototype probe where a multiwall carbon nanotube (MWCNT) is exploited as an excellent example of a high thermal conductivity NW. These results elucidate critical relationships between the performance of the SThM probe on one hand and thermal conductivity, geometry of the probe and its components on the other. As such, they provide a pathway for optimizing current SThM for nanothermal studies of high thermal conductivity materials. Comparison between experimental and modelling results allows...

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Section: Analytical Model Of the Sthm Probementioning

confidence: 99%

Scanning thermal microscopy with heat conductive nanowire probes

et al. 2016

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“…7e lateral resolution can be achieved using SP-SThM probe for other materials or in other environments 19,27 , the resolution of the CNT-SThM clearly was on the par with the best reported results. In addition to the lower thermal resistance of the CNT tip, the lower phonon mismatch between graphene and CNT that defines the interfacial Kapitza resistance, 19 …”

Section: Cnt-sthm Mapping Of Few Layer Graphenementioning

confidence: 65%

“…By substituting the parameters with values for our probe (heater diameter and length ~500 nm, CNT diameter 100 nm and CNT thermal conductivity 1000 Wm -1 K -1 ) 19,28 , estimates of these resistances are: R CNT-heater = 9.410 4 KW -1 . For CNT diameters in the useful range of 25 nm to 100 nm and CNT length of 500 to 1000 nm, the thermal resistance R CNT is in the order of 210 4 to 310 6 KW -1 .…”

Section: Analytical Model Of the Cnt-sthm Probementioning

confidence: 99%

“…All were sequentially sonicated in methanol, isopropanol, and DI water (10 min each), and cleaned in Ar/O 2 plasma cleaner (Zepto LF). The graphene sample was mechanically exfoliated onto the surface by using pressure sensitive tape immediately after plasma cleaning 19 . Fig.…”

Section: Sample Preparation Ultra Large Scale Integration and Few Laymentioning

confidence: 99%

“…11,12 Scanning thermal microscopy (SThM) [11][12][13][14][15][16][17][18][19] has come a long way since its invention 11 in 1986 and currently plays a leading role in the investigation of thermal properties on the nanoscale. SThM use a self-heating thermal sensors incorporated within a sharp tip that is thermally contacted with a sample surface and is widely used in studies of polymeric and organic materials 15 .…”

Section: Introductionmentioning

confidence: 99%

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Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes

Tovee

Pumarol

Rosamond

et al. 2014

Phys. Chem. Chem. Phys.

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We present a new concept of scanning thermal nanoprobe that utilizes the extreme thermal conductance of a carbon nanotube (CNT) to channel heat between the probe and the sample. The integration of CNT in scanning thermal microscopy (SThM) overcomes the main drawbacks of standard SThM probes, where the low thermal conductance of the apex SThM probe is the main limiting factor. The integration of CNT (CNT-SThM) extends SThM sensitivity to thermal transport measurement in higher thermal conductivity materials such as metals, semiconductors and ceramics, while also improving the spatial resolution. Investigation of thermal transport in ultra large scale integration (ULSI) interconnects, using CNT-SThM probe, showed fine details of heat transport in ceramic layer, vital for mitigating electromigration in ULSI metallic current leads. For a few layer graphene, the heat transport sensitivity and spatial resolution of the CNT-SThM probe demonstrated significantly superior thermal resolution compared to that of standard SThM probes achieving 20-30 nm topography and ~30 nm thermal spatial resolution compared to 50-100 nm for standard SThM probes. The outstanding axial thermal conductivity, high aspect ratio and robustness of CNTs can make CNT-SThM the perfect thermal probe for the measurement of nanoscale thermophysical properties and an excellent candidate for the next generation of thermal microscopes.

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A Review on Principles and Applications of Scanning Thermal Microscopy (SThM)

Zhang

Zhu

Hui

et al. 2019

Adv Funct Materials

137

106

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As the size of materials, particles, and devices shrinks to nanometer, atomic, or even quantum scale, it is more challenging to characterize their thermal properties reliably. Scanning thermal microscopy (SThM) is an emerging method to obtain local thermal information by controlling and monitoring probe-sample thermal exchange processes. In this review, key experimental and theoretical components of the SThM system are discussed, including thermal probes and experimental methods, heat transfer mechanisms, calibration strategies, thermal exchange resistance, and effective heat transfer coefficients. Additionally, recent applications of SThM to novel materials and devices are reviewed, with emphasis on thermoelectric, biological, phase change, and 2D materials.

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Direct Nanoscale Imaging of Ballistic and Diffusive Thermal Transport in Graphene Nanostructures

Cited by 90 publications

References 39 publications

Scanning thermal microscopy with heat conductive nanowire probes

Scanning thermal microscopy with heat conductive nanowire probes

Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes

A Review on Principles and Applications of Scanning Thermal Microscopy (SThM)

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