Soft x‐ray photoelectron spectroscopy (SXPS) is a form of x‐ray photoelectron spectroscopy (XPS) that uses a synchrotron light source for the excitation. In the basic form of photoelectron spectroscopy, electrons emitted from a solid surface via the photoelectric effect are collected and energy analyzed to provide information on the electronic structure and chemical composition of the material. Because the mean free path for electrons traveling in solids is small, the spectra reflect the composition of outermost few atomic layers. There are many advantages of SXPS over conventional XPS. For one, the photon energy is tunable, which allows for the surface sensitivity to be maximized, for particular spectral features to be enhanced and for unique types of spectroscopy in which the photon energy is continuously varied. The available spectral resolution in SXPS is also greatly enhanced over a conventional x‐ray source, which allows for the observation of features not otherwise discernible. In addition, the brightness of the beam is much greater than that of conventional x‐ray sources, which enables the detection of very small photoelectron signals. The newest third generation light sources use specialized insertion devices to further increase the brightness, enabling novel forms of SXPS that include ultra‐high‐resolution spectroscopy, photoelectron microscopy, photoelectron diffraction and spin‐polarized photoemission. SXPS has been applied to a wide variety of materials, including metals, semiconductors, adsorbates on surfaces and nanoparticles. The equipment utilized for SXPS includes the electron storage ring, an x‐ray monochromator, and the electron spectrometer.