Direct quantification of TiO2 nanoparticles in suspension by grazing-incidence X-ray fluorescence spectrometry: Influence of substrate pre-treatment in the deposition process

2014 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry

“…The signals from Au, Pd, Pt and Rh samples in the presence of imidazolium propane sulfonate-based zwitterionic surfactants before and aer formation of NPs were found to be essentially identical and detection limits were reported to be in the range of 0.4-3 mg L À1 . Motellier et al 12 used GIXRF to investigate the deposition of TiO 2 NPs in suspension with a particular interest in the inuence of substrate pretreatment. The authors emphasised that the major advantages of this technique was the possibility to analyse the particles without pre-treatment avoiding the harsh acid digestion required by most conventional methods.…”

“…The availability of CRMs for evaluation of accuracy of methods for sample preparation and analysis including TXRF spectrometry was described covering changes during the last 20 years. Motellier et al 12 used GIXRF to investigate the deposition of TiO 2 nanoparticles (NPs) in suspension with a particular interest in the inuence of substrate pre-treatment. The authors emphasised that the major advantage of this technique was the possibility to analyse the particles without pre-treatment thereby avoiding the harsh acid digestion required by most conventional methods.…”

Atomic spectrometry update. Review of advances in the analysis of metals, chemicals and functional materials

“…The Th extraction efficiency was greater than 90%, the amount of 230 Th introduced was negligible and using ICP-MS as a detection technique, the LOD for Th was at the femtogram level. A similar approach was taken by Eppich et al 139 who dated uranium materials using the 235 U/ 231 Pa chronometer. The 231 Pa was determined using a 233 Pa spike that had been prepared from a 237 Np source.…”

“…Two papers have discussed the use of grazing incidence XRF (GIXRF). One by Motellier et al 231 described the direct quantication of TiO 2 nanoparticles in aqueous suspensions and concluded that it was perfectly viable as long as certain precautions were taken. One of these precautions included the binding of the deposited material on the substrate to maintain its homogeneity.…”

Nanoparticle characterization by means of scanning free grazing emission X-ray fluorescence

“…As a surface-sensitive technique GEXRF was applied towards trace-element measurements, [35][36][37][38][39] thin layered systems with respect to the determination of the layer thickness, density, roughness or oxidation 25,[40][41][42][43] and towards (quantitative) depth-profiling experiments of the dopant distributions in ion-implanted samples. 44,45 Disperse particle distributions on the top of a reflecting surface were analyzed by both GEXRF 46,47 and GIXRF, [48][49][50][51][52] mainly in view of the investigation of the particle size.…”