“…Rutherford back scattering (RBS) − and X-ray photoelectron spectroscopy (XPS), , neutron activation analysis, , and radiotracer methods have been used for determination of the mass thickness of Au thin films. Chemical methods for Au analysis in solutions include atomic absorption spectroscopy, , inductively coupled plasma mass spectrometry, , X-ray fluorescence, spectrophotometry, − and electrochemical stripping analysis. − Among the variety of analytical methods, spectrophotometric determination of the concentration of chloroaurate ion (AuCl 4 − ) in solution seems attractive due to the simplicity of the procedure and the required equipment. The objective of the present study was to develop a simple analytical procedure for the determination of the mass thickness of nanostructured Au films which can be used routinely in a materials research laboratory.…”