1996
DOI: 10.1111/j.1365-2818.1996.tb00004.x
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Direct‐view microscopy: optical sectioning strength for finite‐sized, multiple‐pinhole arrays

Abstract: Key words. Confocal microscopy, direct-view microscopy, multiple-pinhole source and detector arrays, optical sectioning strength, light budget. SummaryDirect-view microscopes use multiple-aperture arrays in the source and detector planes. We develop a theory for brightfield and fluorescence direct-view microscopy which allows us to determine the optical sectioning strength for finite-sized, multiple-pinhole arrays with an arbitrary distribution of apertures. We specialize to the cases of square, hexagonal and … Show more

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Cited by 18 publications
(6 citation statements)
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“…The combination of RESOLFT and structured illumination therefore promises <50-60 nm with sub-second image acquisition times of >50 × 50 μm 2 fields of view (Rego et al 2012). A more advanced illumination pattern than using parallel lines of high intensities as in conventional SIM is the scanning with thousands of parallelized points as in spinning-disc microscopy (McCabe et al 1996) or in multifocal SIM (York et al 2012). Similarly, more than 100 000 doughnuts were generated simultaneously for ultra-fast live-cell RESOLFT imaging of large fields of view with down to 70 nm spatial resolution (Chmyrov et al 2013) (Fig.…”
Section: Parallelizationmentioning
confidence: 99%
See 1 more Smart Citation
“…The combination of RESOLFT and structured illumination therefore promises <50-60 nm with sub-second image acquisition times of >50 × 50 μm 2 fields of view (Rego et al 2012). A more advanced illumination pattern than using parallel lines of high intensities as in conventional SIM is the scanning with thousands of parallelized points as in spinning-disc microscopy (McCabe et al 1996) or in multifocal SIM (York et al 2012). Similarly, more than 100 000 doughnuts were generated simultaneously for ultra-fast live-cell RESOLFT imaging of large fields of view with down to 70 nm spatial resolution (Chmyrov et al 2013) (Fig.…”
Section: Parallelizationmentioning
confidence: 99%
“…A more advanced illumination pattern than using parallel lines of high intensities as in conventional SIM is the scanning with thousands of parallelized points as in spinning-disc microscopy (McCabe et al . 1996) or in multifocal SIM (York et al . 2012).…”
Section: The Coordinate-targeted Approachmentioning
confidence: 99%
“…To lower the excitation intensity and speed up the imaging acquisition time, it was proposed to use parallelized illumination instead of single-spot scanning. One approach called spinning disk confocal microscopy generates multifocal spots [137,138] by a Nipkow-type pinhole array disk and a microlens array [139], and the generated signal is projected onto a camera. Its pattern is similar to multifocal SIM shown in Figure 4E, but has an equal-pitch spiral shape to ensure the beam uniformity.…”
Section: Parallelized Illumination and Linescanning Confocal Microscopymentioning
confidence: 99%
“…Alternatively, spinning disk systems [8][9][10][11][12] and programmable array systems [13][14][15][16] evaluate several lateral points in parallel. To reduce the cross talk between the lateral channels the pinholes have to be well separated, e.g., by ten times the pinhole diameter [17]. Array systems thus usually include a lateral scanning motion to cover the blank areas between the pinholes.…”
Section: Introductionmentioning
confidence: 99%