1994
DOI: 10.1021/la00024a003
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Direct Visualization of Surfactant Hemimicelles by Force Microscopy of the Electrical Double Layer

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Cited by 611 publications
(695 citation statements)
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“…We believe that one structurally realistic possibility is the formation of hemimicelles along the chain, as has previously been observed with ionic surfactants adsorbed onto hydrophobic surfaces. 29 Significant differences were found between the specific conductivity of surfactant and surfactant-polymer solutions in DMSO-water mixtures (4% v/v) for small additions of surfactant in all of the systems studied, when the surfactant and polymer concentrations (in terms of repeat unit) are comparable (see Figure 9A). In the pure surfactant system, specific conductivity grows linearly over the whole concentration range up to the cmc with a constant slope of the plot of κ versus surfactant concentration.…”
Section: Resultsmentioning
confidence: 88%
“…We believe that one structurally realistic possibility is the formation of hemimicelles along the chain, as has previously been observed with ionic surfactants adsorbed onto hydrophobic surfaces. 29 Significant differences were found between the specific conductivity of surfactant and surfactant-polymer solutions in DMSO-water mixtures (4% v/v) for small additions of surfactant in all of the systems studied, when the surfactant and polymer concentrations (in terms of repeat unit) are comparable (see Figure 9A). In the pure surfactant system, specific conductivity grows linearly over the whole concentration range up to the cmc with a constant slope of the plot of κ versus surfactant concentration.…”
Section: Resultsmentioning
confidence: 88%
“…This is an important advance because there are relatively few techniques for probing and visualizing charge at interfaces. Although atomic force microscopy (AFM) can be used, [24][25][26][27] it employs a tip of (nominally) fixed charge that may change during a scan (e.g. by contamination or tip wear), and the force-distance characteristics are influenced by several forces as well as electrostatic forces.…”
Section: Introductionmentioning
confidence: 99%
“…35,36 Pioneered by Manne and co-workers, this technique revealed that surfactants form surface aggregates in the shape of full 36 or half [35][36][37][38] cylinders or full 36 or half 39 spheres, as well as flat layers, 36,40 depending on the system under investigation. These findings have been confirmed by computational investigations.…”
Section: Introductionmentioning
confidence: 99%
“…These findings have been confirmed by computational investigations. 41 AFM imaging of surfactant surface micelles, however, has been limited to extremely flat substrates such as atomically smooth graphite [35][36][37][42][43][44][45] and mica. 36,40,42 Amorphous silica that forms as a native oxide on highly smooth silicon has been the third most popular substrate.…”
Section: Introductionmentioning
confidence: 99%