2021
DOI: 10.1002/adom.202101334
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Disorder‐Induced Dispersive Magneto‐Electroluminescence of Blue Emitters in Organic Light Emitting Diodes

Abstract: Disorder‐induced inhomogeneity in blue‐fluorescent‐based organic light‐emitting diodes (OLEDs) based on mixtures of host and guest molecules is studied using magneto‐electroluminescence, MEL(B), response based on the so called “Δg mechanism”, where Δg is the difference in the Landé g‐factor of electrons and holes. The disorder in the organic active layer is manifested by a unique non‐Lorentzian MEL(B) response that is analyzed using a distribution of spin lifetimes for the injected electron–hole pairs that is … Show more

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Cited by 7 publications
(3 citation statements)
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“…[34,35] PP 1 and PP 3 can interconvert through ISC and RISC processes because they are almost degenerate in energy and the spin flipping can be realized under the hyperfine interaction (HFI). [3,[34][35][36][37] Although it is reported that the spin flipping between PP 1 and PP 3 also can be induced by Δg mechanism, [20,[38][39][40][41] Δg mechanism could be ruled out in this work. The related discussion is shown in Text S1, Supporting Information.…”
Section: Analysis Of Physical Microscopic Processes In Dev 1 and Devmentioning
confidence: 99%
“…[34,35] PP 1 and PP 3 can interconvert through ISC and RISC processes because they are almost degenerate in energy and the spin flipping can be realized under the hyperfine interaction (HFI). [3,[34][35][36][37] Although it is reported that the spin flipping between PP 1 and PP 3 also can be induced by Δg mechanism, [20,[38][39][40][41] Δg mechanism could be ruled out in this work. The related discussion is shown in Text S1, Supporting Information.…”
Section: Analysis Of Physical Microscopic Processes In Dev 1 and Devmentioning
confidence: 99%
“…S1, ESI †). 43 After inserting the FM Co and Ni nanolayers, the room temperature MEL decreases to B18.8% and the FWHM increases to 48.9 mT. The decrease in MEL may be related to the reduced electron injection ability caused by the Ni cathode.…”
Section: Resultsmentioning
confidence: 95%
“…Steady MFE measurements were further performed on devices to reveal the important role of DET from exciplex host to DCJTB guest. External magnetic field can slightly alter the formation ratio of singlet to triplet in exciplex host, causing an MFE on EL intensity [25][26][27][28][29][30][31][32]. In an energy transfer host-guest system, the DCJTB emission will certainly inherit the host MFE profiles.…”
Section: Resultsmentioning
confidence: 99%