Dispersion Curve Engineering of TiO2/Silver Hybrid Substrates for Enhanced Surface Plasmon Resonance Detection

El-Gohary, Sherif H.; Choi, Munsik; Kim, Young L.; Byun, Kyung Min

doi:10.3390/s16091442

Cited by 16 publications

(11 citation statements)

References 35 publications

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“…A variety of SPR sensors have been proposed and confirmed [5,[7][8][9][10][11][12][13][14] which utilize extreme sensitivity of the SPR effect to refractive index changes of the surrounding medium at a metaldielectric interface. In addition, because the resonance condition is accompanied by the amplitude and phase changes of reflected light wave, different physical quantities such the intensity [5], phase [7], resonant angle [8] or the resonant wavelength [9] can be measured to detect the SPR effect.…”

Section: Introductionmentioning

confidence: 99%

“…In addition, because the resonance condition is accompanied by the amplitude and phase changes of reflected light wave, different physical quantities such the intensity [5], phase [7], resonant angle [8] or the resonant wavelength [9] can be measured to detect the SPR effect. Similarly, different experimental arrangements can be utilized so that the angular [10,11] and wavelength interrogations [12][13][14] are possible.…”

Section: Introductionmentioning

confidence: 99%

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Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Hlubina

Luňáčková

Ciprián

2019

Opt. Mater. Express

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We report on a new method for measuring the wavelength dependence of the complex permittivity of a thin gold film of a surface plasmon resonance (SPR) structure comprising a gold-coated SF10 slide with an adhesion film of chromium attached to an SF10 glass prism. The method is based on spectral interferometry and utilizes a setup with a birefringent crystal and the SPR structure in the Kretschmann configuration, in which channeled spectra are recorded and from them, the phase functions of the SPR for air at different angles of incidence are retrieved. The SPR phenomenon is manifested as an abrupt phase change with respect to the reference phase difference for the interference resolved with the SF10 glass prism alone. The phase changes for different angles of incidence are processed in the vicinity of the resonance wavelengths to obtain the real and imaginary parts of the complex permittivity in a wavelength range from 530 to 850 nm or equivalently, the parameters of a modified Drude-Lorentz model. This research, to the best of the authors' knowledge, is the first demonstration of spectral interferometry-based measurement of the complex permittivity function of a thin metal film, which is important from the point of view of material characterization directly performed in the Kretschmann configuration. The performance of the SPR sensor is strongly influenced by the choice of a thin metal film so it is crucial to know the complex permittivity function of the metal. Standard techniques to characterize thin metal films include spectral ellipsometry [15][16][17] and spectral reflectometry [18].

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Hlubina

Luňáčková

Ciprián

2019

Opt. Mater. Express

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“…Unfortunately, plasmonic resonances are typically broad, mostly due to Ohmic loss in the metal 10 . In this regard, coating the Kretschmann configuration prism by thin multilayers was recently reported theoretically and shown experimentally to allow the engineering of the dispersion curve 11 , 12 . Periodic structures have been shown to provide better figure of merit for sensing via dispersion engineering and in particular via the increase in group index, leading to the narrowing of the resonance linewidth 13 , 14 .…”

Section: Introductionmentioning

confidence: 99%

Dispersion engineering with plasmonic nano structures for enhanced surface plasmon resonance sensing

Arora

Talker

Mazurski

et al. 2018

Sci Rep

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We demonstrate numerically and experimentally the enhancement of Surface Plasmon Resonance (SPR) sensing via dispersion engineering of the plasmonic response using plasmonic nanograting. Following their design and optimization, the plasmonic nanograting structures are fabricated using e-beam lithography and lift-off process and integrated into conventional prism based Kretschmann configuration. The presence of absorptive nanograting near the metal film, provides strong field enhancement with localization and allows to control the dispersion relation which was originally dictated by a conventional SPR structure. This contributes to the enhancement in Q factor which is found to be 3–4 times higher as compared to the conventional Kretschmann configuration. The influence of the incident angle on resonance wavelength is also demonstrated both numerically and experimentally, where, only a negligible wavelength shift is observed with increasing the incident angles for plasmonic nanograting configuration. This surprising feature may be helpful for studying and utilizing light-matter interaction between plasmons and narrow linewidth media (e.g. Rb atom or molecule) having nonlocalities in their susceptibility-momentum relation. Finally, we analyze the role of plasmonic nanograting in enhancing the performance of an SPR sensor. Our results indicate that the integrated SPR-nanograting device shows a great promise as a sensor for various types of analytes.

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“…In the Kretschmann configuration, the SPR phenomenon can be resolved in an angular or spectral domain (angular or wavelength interrogation). Considering the angular interrogation [ 10 , 11 , 12 ], a monochromatic beam is used and a sharp minimum (dip) is observed in the angular spectrum. Similarly, in the wavelength interrogation [ 13 , 14 , 15 ], a dip is observed in the reflection spectrum.…”

Section: Introductionmentioning

confidence: 99%

Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film

Chlebus

Chylek

Ciprián

et al. 2018

Sensors

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A spectral method based on surface plasmon resonance (SPR) in air is used to measure the dielectric function of a thin metal film. The method utilizes the spectral dependence of the ratio of the reflectances of p- and s-polarized waves measured in the Kretschmann configuration at different angles of incidence. By processing these dependences in the vicinity of a dip, or equivalently near the resonance wavelength, and using the dispersion characteristics of a metal film according to a proposed physical model, the real and imaginary parts of the dielectric function of the metal can be determined. The corresponding dielectric function of the metal is obtained by a least squares method for such a thickness minimizing the difference between the measured and theoretical dependence of the resonance wavelength on the the angle of incidence. The feasibility of the method is demonstrated in measuring the dielectric function of a gold film of an SPR structure comprising an SF10 glass prism and a gold coated SF10 slide with an adhesion film of chromium. The dielectric function according to the Drude–Lorentz model with two additional Lorentzian terms was determined in a wavelength range from 534 to 908 nm, and the results show that the gold film is composed of homogenous and rough layers with thicknesses 42.8 nm and 2.0 nm, respectively. This method is particularly useful in measuring the thickness and dielectric function of a thin metal film of SPR structures, directly in the Kretschmann configuration.

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Dispersion Curve Engineering of TiO2/Silver Hybrid Substrates for Enhanced Surface Plasmon Resonance Detection

Cited by 16 publications

References 35 publications

Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Dispersion engineering with plasmonic nano structures for enhanced surface plasmon resonance sensing

Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film

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