“…The presence of Ti-O-Si bonds has been reported in TiO 2 -SiO 2 oxide systems [35][36][37], and in TiO 2 films deposited on to SiO 2 [5][6][7]. The Ti 2p 3/2 core level spectrum for the clean (1 · 2) surface reconstruction is characterized by the presence of two components (see Table 2), the main one located at 458.5 eV corresponds to Ti 4+ species [23,34,38]. The second one centered at 456.8 eV (DE = 1.7 eV) matches with Ti 3+ species [18,23,24,39,40], and it is related to its presence in the (1 · 2) surface reconstruction.…”