2015
DOI: 10.1016/j.egypro.2015.07.040
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Dissolution of Electrically Inactive Phosphorus by Low Temperature Annealing

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Cited by 8 publications
(2 citation statements)
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“…Q f was set to + 3.5•10 12 q/ cm 2 as measured at the sample rear side in Table 1. To achieve simulated values of J 0 similar to those measured in the (n + pn + ) sample before sample treatment, an additional SRH recombination had to be added to the emitter, representing recombination, e.g., due to inactive P [37] or surface-near damage induced by sample processing [38].…”
Section: Device Simulationsmentioning
confidence: 99%
“…Q f was set to + 3.5•10 12 q/ cm 2 as measured at the sample rear side in Table 1. To achieve simulated values of J 0 similar to those measured in the (n + pn + ) sample before sample treatment, an additional SRH recombination had to be added to the emitter, representing recombination, e.g., due to inactive P [37] or surface-near damage induced by sample processing [38].…”
Section: Device Simulationsmentioning
confidence: 99%
“…It must also be noted that an additional benefit of a low temperature anneal comes from a reduction in the emitter saturation current density as compared to a process without annealing, as has been shown recently in [13]. This paper deals with the consequences of an extended co-firing step on solar cell performance.…”
mentioning
confidence: 99%