2006
DOI: 10.1063/1.2378526
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Domain nucleation and hysteresis loop shape in piezoresponse force spectroscopy

Abstract: Electromechanical hysteresis loop measurements in Piezoresponse Force Microscopy

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Cited by 58 publications
(42 citation statements)
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“…This simple interpretation was supported by the exact 24,25 and decoupled theories 26,27 that related the measured signal, piezoelectric, dielectric, and elastic properties of materials, and domain/wall geometries, [28][29][30] often with the analyses available in the form of simple linear relationships. Jointly, these theoretical developments provide well developed numerical foundation of PFM, and establish the veracity of physical interpretations.…”
mentioning
confidence: 79%
“…This simple interpretation was supported by the exact 24,25 and decoupled theories 26,27 that related the measured signal, piezoelectric, dielectric, and elastic properties of materials, and domain/wall geometries, [28][29][30] often with the analyses available in the form of simple linear relationships. Jointly, these theoretical developments provide well developed numerical foundation of PFM, and establish the veracity of physical interpretations.…”
mentioning
confidence: 79%
“…As such, PFS hysteresis measurements convey information differently than those related to hysteresis loops that are measured in capacitor structures, which reflect a multitude of nucleation events occurring within an extended period of time. 71,72 The PFS hysteresis loops often contain reproducible fine structure features (kinks) somewhat similar to structures in forcedistance curves in AFM. The studies by Alexe's group have associated the presence of the fine structure features with their proximity to a ferroelastic domain wall.…”
Section: Switching Spectroscopy By Pfmmentioning
confidence: 99%
“…In this case, the emergence of remnant states correspond to formation and growth of classical ferroelectric domains, well explored both analytically [301][302][303][304] and via phase field modelling. 305,306 The general features of this process involve nucleation above certain threshold voltage and subsequent growth with time and bias.…”
Section: Ferroelectric Switchingmentioning
confidence: 99%