Aberration correction has caused something of a revolution in electron microscopy. In Scanning Transmission Electron Microscopy (STEM), the enhanced sensitivity and resolution have enabled the detection of single atoms [1] and the resolving of sub-Ångstrom spacings [2] on an almost routine basis. Additionally, there have been a number of unexpected benefits from aberration correction. Firstly, because the Rayleigh diffraction limit is given by: 0.61λ/θ, in order to take advantage of the reduced aberrations, the objective aperture θ must be made larger. Thus aberration correction not only allows a smaller probe size, but also admits the possibility of increased current inside that smaller probe. Secondly, this increased aperture size allows a new technique for 3-dimensional imaging [3,4], similar to optical confocal microscopy. For a diffraction limited system, in the absence of aberrations, the depth of field is commonly defined [5] as: λ/θ 2 . This is the 80% of maximum on axis criteria, so in practice the depth resolution is a little worse than this. Even in the presence of aberrations, we would expect this result to be approximately true, because the aperture is normally chosen so that it is just smaller than the angle at which the aberrations become significant.Three-dimensional imaging is important because all real samples are three-dimensional, yet most microscope images are two-dimensional representations of a sample and it is not always possible to reconstruct a three-dimensional model from these images. In addition, the limited depth of focus will become even more relevant with improvements in corrector design, because it is already comparable to specimen thickness. Thus for many samples, the variations in height are far larger than the depth of field in a C s -corrected system. So this is not just a way to extract new information; it will become essential to consider the reduced depth of focus in order to interpret images from any non-flat sample. Similarly, for the case of single atoms buried in an amorphous substrate, it has been shown [4] that the single atoms are not necessarily visible unless the beam is focused within the sample. Thus, even where three-dimensional information is not explicitly required, it may be essential to use this technique in order to extract the correct distribution of dopants or impurities. In aligned crystals, the electrons are attracted to the columns of atoms, which is sometimes known as channeling, so there the behavior is more complicated [6]. This also has implications for tomography. If the depth of focus is too small, then the images at different tilts are not simple projections and the approximations used to derive the tomographic reconstruction are no longer valid, in which case tomography will necessarily involve some form of deconvolution.By reciprocity, the bright field (BF) STEM image is equivalent to the BF TEM image. The main reason that the STEM is not more widely used for BF imaging is that the efficiency is very low. Only a small fraction of the electron...