Dosage de l'aluminium par spectrometrie d'absorption atomique et diffraction des rayons X dans des couches epitaxiees par jets moleculaires de Ga1− xAlxAs

Baudet, M.; Regreny, O.; Dupas, G.; Auvray, P; Gauneau, M.; Regreny, A.; Talalaeff, G.

doi:10.1016/0025-5408(83)90072-7

Materials Research Bulletin

1983

DOI: 10.1016/0025-5408(83)90072-7

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Dosage de l'aluminium par spectrometrie d'absorption atomique et diffraction des rayons X dans des couches epitaxiees par jets moleculaires de Ga1− xAlxAs

M. Baudet¹,

O. Regreny²,

G. Dupas³

et al.

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Cited by 9 publications

References 16 publications

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Dosage de l'aluminium par spectrometrie d'absorption atomique et diffraction des rayons X dans des couches epitaxiees par jets moleculaires de Ga1− xAlxAs

Cited by 9 publications

References 16 publications

X-Ray double crystal rocking curves of Ga1−x Al x As/GaAs laser structures

X-Ray double crystal rocking curves of Ga1−x Al x As/GaAs laser structures

Accurate determination of lattice mismatch in the epitaxial AlAs/GaAs system by high-resolution X-ray diffraction

Comprehensive analysis of the composition determination in epitaxial Al Ga As films: A multitechnique approach

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