Double-tip piezoresponse force microscopy for quantitative measurement of the piezoelectric coefficient at the nanoscale

Pan, Kai; Liu, Y. M.; Peng, Jinlin; Liu, Y. Y.

doi:10.1209/0295-5075/104/67001

Cited by 4 publications

(2 citation statements)

References 35 publications

(30 reference statements)

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“…We used spatially resolved PFM to measure the piezoelectric constant. Steps toward quantification of d from PFM have been reported using different approaches, including low-frequency measurements far away from contact resonance frequencies and the use of static sensitivity or background removal, calibration on domain walls, , specialized cantilevers, , and interferometric approaches that complement PFM measurements on top electrodes. − Other recent work includes the modeling of the cantilever beam shape and the introduction of a correction factor to compare cantilevers of different stiffnesses for PFM performed near or at the contact resonance frequency. , It is not only important to quantify the surface displacement but also to consider the non-piezoelectric PFM contrast mechanism including cross-talk, , electrostatic forces between cantilever and sample, Joule heating, , charge injection, and ionic motion …”

Section: Resultsmentioning

confidence: 99%

Local Strain and Polarization Mapping in Ferrielectric Materials

Neumayer

Lei

O’Hara

et al. 2020

ACS Appl. Mater. Interfaces

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CuInP2S6 (CIPS) is a van der Waals material that has attracted attention because of its unusual properties. Recently, a combination of density functional theory (DFT) calculations and piezoresponse force microscopy (PFM) showed that CIPS is a uniaxial quadruple-well ferrielectric featuring two polar phases and a total of four polarization states that can be controlled by external strain. Here, we combine DFT and PFM to investigate the stress-dependent piezoelectric properties of CIPS, which have so far remained unexplored. The two different polarization phases are predicted to differ in their mechanical properties and the stress sensitivity of their piezoelectric constants. This knowledge is applied to the interpretation of ferroelectric domain images, which enables investigation of local strain and stress distributions. The interplay of theory and experiment produces polarization maps and layer spacings which we compare to macroscopic X-ray measurements. We found that the sample contains only the low-polarization phase and that domains of one polarization orientation are strained, whereas domains of the opposite polarization direction are fully relaxed. The described nanoscale imaging methodology is applicable to any material for which the relationship between electromechanical and mechanical characteristics is known, providing insight on structural, mechanical, and electromechanical properties down to ∼10 nm length scales.

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Section: Resultsmentioning

confidence: 99%

Local Strain and Polarization Mapping in Ferrielectric Materials

Neumayer

Lei

O’Hara

et al. 2020

ACS Appl. Mater. Interfaces

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“…Steps toward quantification of d through SPMbased techniques have been reported using different approaches. Most of them include low frequency measurements far away from contact resonance frequencies and the use of static sensitivity or background removal [27] or even double tip approaches [28]. Recently, interferometric approaches have been described which complimented PFM measurements on top electrodes [29] or even replaced PFM [30].…”

Section: Introductionmentioning

confidence: 99%

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

et al. 2016

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Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of atomic force microscopy (AFM) have been shown capable of detecting ∼1-3 pm-level surface displacements, an approach used in techniques such as piezoresponse force microscopy, atomic force acoustic microscopy, and ultrasonic force microscopy. Here, based on an analytical model of AFM cantilever vibrations, we demonstrate a guideline to quantify surface displacements with high accuracy by taking into account the cantilever shape at the first resonant contact mode, depending on the tip-sample contact stiffness. The approach has been experimentally verified and further developed for piezoresponse force microscopy (PFM) using well-defined ferroelectric materials. These results open up a way to accurate and precise measurements of surface displacement as well as piezoelectric constants at the pm-scale with nanometer spatial resolution and will allow avoiding erroneous data interpretations and measurement artifacts. This analysis is directly applicable to all cantilever-resonance-based scanning probe microscopy (SPM) techniques.

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Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscale

Balke

Tselev

2018

Metal Oxide-Based Thin Film Structures

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Double-tip piezoresponse force microscopy for quantitative measurement of the piezoelectric coefficient at the nanoscale

Cited by 4 publications

References 35 publications

Local Strain and Polarization Mapping in Ferrielectric Materials

Local Strain and Polarization Mapping in Ferrielectric Materials

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscale

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