2014
DOI: 10.1063/1.4891237
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Drastic reduction in the surface recombination velocity of crystalline silicon passivated with catalytic chemical vapor deposited SiNx films by introducing phosphorous catalytic-doped layer

Abstract: We improve the passivation property of n-type crystalline silicon (c-Si) surface passivated with a catalytic chemical vapor deposited (Cat-CVD) Si nitride (SiNx) film by inserting a phosphorous (P)-doped layer formed by exposing c-Si surface to P radicals generated by the catalytic cracking of PH3 molecules (Cat-doping). An extremely low surface recombination velocity (SRV) of 2 cm/s can be achieved for 2.5 Ω cm n-type (100) floating-zone Si wafers passivated with SiNx/P Cat-doped layers, both prepared in Cat-… Show more

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Cited by 16 publications
(21 citation statements)
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References 28 publications
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“…1 is that P Cat-doping is effective in improving τ eff and implied V oc , as has been reported previously. 17,18,[21][22][23] When focusing on the T cat dependence of τ eff and implied V oc , τ eff and implied V oc show maximum values at T cat of around 900 °C.…”
Section: Resultsmentioning
confidence: 99%
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“…1 is that P Cat-doping is effective in improving τ eff and implied V oc , as has been reported previously. 17,18,[21][22][23] When focusing on the T cat dependence of τ eff and implied V oc , τ eff and implied V oc show maximum values at T cat of around 900 °C.…”
Section: Resultsmentioning
confidence: 99%
“…[17][18][19][20][21][22][23] This novel doping technique, referred to as "Cat-doping", can be performed at significantly low substrate temperatures of less than 200°C, and is thus applicable to the fabrication of a-Si= c-Si heterojunction solar cells. We have already confirmed the effectiveness of P Cat-doping in reducing the SRV of minority carriers on n-type c-Si wafers.…”
Section: Introductionmentioning
confidence: 99%
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“…16,17) Cat-CVD can realize low-damage deposition of passivation films due to its plasma-damage-less nature, and we have thus far demonstrated high-quality passivation films formed by Cat-CVD. [18][19][20][21][22][23][24] In this study, we attempt to form ultra-thin SiN x films aiming at the utilization of the SiN x as the substitute of tunneling SiO 2 in the TOPCon structure.…”
Section: Introductionmentioning
confidence: 99%