Dual‐beam versus single‐beam depth profiling: Same sample in same instrument

Baryshev, Sergey V.; Becker, Nicholas; Zinovev, A. V.; Tripa, C. E.; Veryovkin, I. V.

doi:10.1002/rcm.6749

Cited by 3 publications

(1 citation statement)

References 14 publications

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“…The test samples were depth profiled using a time-offlight SIMS instrument in the traditional single beam mode [11]. The 60 • oblique 5 kV Ar + ion beam was focused to a spot of 30 µm in diameter at a current of 80±8 nA as measured by in situ Faraday cup.…”

Section: General Description Of the Imager Imaging And Measurement Ementioning

confidence: 99%

Electron emission projection imager

Baturin

Baryshev

2017

Review of Scientific Instruments

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A new projection type imaging system is presented. The system can directly image the field emission site distribution on a cathode surface by making use of anode screens in the standard parallel plate configuration. The lateral spatial resolution of the imager is on the order of 1-10 μm. The imaging sensitivity to the field emission current can be better than the current sensitivity of a typical electrometer, i.e., less than 1 nA.

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Section: General Description Of the Imager Imaging And Measurement Ementioning

confidence: 99%

Electron emission projection imager

Baturin

Baryshev

2017

Review of Scientific Instruments

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Alkali-metal-enhanced grain growth in Cu₂ZnSnS₄ thin films

Johnson

Baryshev

Thimsen

et al. 2014

Energy Environ. Sci.

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135

130

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The highest efficiency solar cells based on copper zinc tin sulfide (CZTS), a promising photovoltaic material comprised of earth abundant elements, are built on soda lime glass (SLG), a substrate which contains many impurities, including Na and K. These impurities may diffuse into CZTS films during processing and affect film structure and properties. We have investigated the effects of these impurities on the microstructure of CZTS films synthesized by ex situ sulfidation of Cu-Zn-Sn alloy films co-sputtered on SLG, Pyrex, and quartz.CZTS films synthesized on SLG were found to have significantly larger grains than films grown on the other substrates. Furthermore, we show that by including a bare additional piece of SLG in the sulfidation ampoule, the grain size of films grown on nominally impurity-free quartz increases from 100's of nm to greater than 1 mm. This demonstrates conclusively that impurities in SLG volatilize in S-containing atmospheres and incorporate into nearby CZTS films synthesized on other substrates. Impurity concentrations in these CZTS films were examined using depth profiling with time-of-flight secondary ion mass spectrometry (TOF-SIMS). Of all the impurities present in SLG, the TOF-SIMS experiments implicated Na, K, and Ca as possible elements responsible for the enhanced grain growth. To investigate the effects of these impurities individually, we introduced very small and controllable amounts of Na, K, or Ca into the sulfidation ampoule during CZTS synthesis. Impurity amounts as low as 10 À6 moles of Na or 10 À7 moles of K resulted in a dramatic increase in grain size, from 100's of nm to several microns, for films deposited on quartz, while Ca loading had no visible effect on the final microstructure. Based on this vapor transport mechanism, we thus demonstrate an approach for delivering precisely controlled amounts of specific impurities into CZTS films on arbitrary substrates to facilitate large-grain growth. Broader contextState-of-the-art thin-lm solar cells use cadmium telluride or copper indium gallium selenide as the light absorbing material. However, the production of these solar cells may be limited to less than 1 terawatt by the scarcity of tellurium and indium, and possibly by the toxicity of cadmium. These sustainability concerns provide a strong motivation to search for new photovoltaic materials comprised of nontoxic and abundant elements. The rapid rise in power conversion efficiencies of solar cells based on copper zinc tin sulde and selenide (CZTS and CZTSe) attests to their potential as low-cost, earth-abundant solar absorber materials. One of the properties that affects the CZTS solar cell performance is the lm's microstructure. Ideally, a monolayer of single crystal grains with sizes on the order of the lm thickness (1-3 micrometers) is required. The present study shows the remarkable effects of the presence of very small amounts of alkali metal atom impurities in enhancing grain growth in CZTS thin lms. The article also presents an approach for delivering preci...

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Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

Winograd

2018

Annual Rev. Anal. Chem.

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Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of clusters containing thousands of particles, initiate desorption of target molecules with high yield and minimal fragmentation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of the cluster ion/solid interaction are developed to maximize conditions for successful mass spectrometry. In addition, the history of how GCIBs have become practical laboratory tools is reviewed. Special emphasis is placed on the versatility of these sources, as size, kinetic energy, and chemical composition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. Recent examples of bioimaging applications are also presented.

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Dual‐beam versus single‐beam depth profiling: Same sample in same instrument

Cited by 3 publications

References 14 publications

Electron emission projection imager

Electron emission projection imager

Alkali-metal-enhanced grain growth in Cu₂ZnSnS₄ thin films

Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

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Dual‐beam versus single‐beam depth profiling: Same sample in same instrument

Cited by 3 publications

References 14 publications

Electron emission projection imager

Electron emission projection imager

Alkali-metal-enhanced grain growth in Cu2ZnSnS4 thin films

Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

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Alkali-metal-enhanced grain growth in Cu₂ZnSnS₄ thin films