2013
DOI: 10.1007/s12043-013-0532-5
|View full text |Cite
|
Sign up to set email alerts
|

Durability of rewritable phase-change Ge X Sb Y Te1 − X − Y memory devices

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
4
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(4 citation statements)
references
References 29 publications
0
4
0
Order By: Relevance
“…The as-deposited thin film shows in an amorphous structure while the annealed film shows in a cubic structure (c-GeSbTe), as confirmed by major XRD peaks of (111), (200), (222), and (220) planes according to PDF# 054-0484 data [12]. These XRD peaks have been demonstrated in the crystallinity and the crystal structure of intermediate states during the amorphous-crystalline solid-state transformation within sequentially annealing temperature [7][8][9][10][11]13]. The crystallite sizes (D), lattice strains (ε), and lattice parameters of c-GeSbTe thin films were evaluated from a width at half maximum (FWHM) of XRD patterns, based on the Scherrer's equation as the following:…”
Section: Resultsmentioning
confidence: 80%
See 2 more Smart Citations
“…The as-deposited thin film shows in an amorphous structure while the annealed film shows in a cubic structure (c-GeSbTe), as confirmed by major XRD peaks of (111), (200), (222), and (220) planes according to PDF# 054-0484 data [12]. These XRD peaks have been demonstrated in the crystallinity and the crystal structure of intermediate states during the amorphous-crystalline solid-state transformation within sequentially annealing temperature [7][8][9][10][11]13]. The crystallite sizes (D), lattice strains (ε), and lattice parameters of c-GeSbTe thin films were evaluated from a width at half maximum (FWHM) of XRD patterns, based on the Scherrer's equation as the following:…”
Section: Resultsmentioning
confidence: 80%
“…Moreover, in modern technology, Ge-Sb-Te chalcogenide ternary compounds are widely used because of their stable phase transformation between amorphous and crystalline phases [7]. The Ge-Sb-Te system has studied the several possible compositions of GeSb 2 Te 4 , GeSb 4 Te 7 , and Ge 2 Sb 2 Te 5 shown in a Ge-Sb-Te phase diagram [8][9]. The Ge 2 Sb 2 Te 5 has been the preferred thermoelectric material with high Seebeck coefficient and low electrical resistivity [10][11].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The variation of structures from FCC to HCP at 653 K has the highest concentration of charge carriers, the lowest electrical resistivity, and the highest power factor, respectively. Hence, the GST system has become a new material of interest for thin-film thermoelectrics and other applications within the many to compound from phase diagram [18] and electronic structure like to semi-metallic behavior [19] such as; Ge 2 Sb 2 Te 5 , GeSb 2 Te 4 and GeSb 4 Te 7 , etc. In order to prepare thin films of the chalcogenide materials, several deposition techniques can be utilized, i.e., by thermal evaporation [20], magnetron sputtering [21], pulsed laser deposition (PLD) [22], solegel process [23], and chemical vapor deposition (CVD) [24].…”
Section: Introductionmentioning
confidence: 99%