“…A myriad of ex situ materials characterization methods has been employed to determine the interfacial structure of DSC working electrodes outside of the device, including imaging (atomic force microscopy, − scanning tunneling microscopy (STM) , ), X-ray scattering (grazing-incidence X-ray scattering, X-ray reflectometry (XRR) ,− ), X-ray diffraction, − and optical, vibrational (infrared (IR) and Raman), − X-ray absorption, − and photoelectron spectroscopy. , These studies have managed to quantify the essence of dye/TiO 2 interfacial structures that represent an exposed DSC working electrode. However, none of them have been able to directly probe this dye/TiO 2 interfacial structure while it is held within its DSC device assembly.…”