Dynamic Current Testing for CMOS Domino Circuits

Abstract

In this paper, we propose a method for testing domino CMOS circuits using the transient power supply current. The method is based on monitoring the peak value of the transient current. We also present a test vector generation algorithm for testing large domino circuits. We evaluate the effectiveness of this testing method through simulations of various domino circuits of different sizes. Furthermore, we develop and implement a clustering technique to improve the fault coverage of the test method when used with large circuits. The algorithm divides the circuit into different clusters where each cluster is fed by a different power supply branch.