Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments

Yamada, Hirofumi; Kobayashi, Kei

doi:10.1007/978-3-540-37319-3_7

Cited by 6 publications

(7 citation statements)

References 62 publications

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“…The resulting thermal noise equivalent force then is F ¼ K ffiffiffiffiffiffiffiffiffi ffi z 2 th q [72]. Note that this is analogous to the Johnson-Nyquist noise-generated voltage across a resistor in an electrical system.…”

Section: Fundamental Limits To Resolutionmentioning

confidence: 98%

“…2, AFM force measurements (at room temperature) are limited to approximately 0.1 pN resolution, whereas subattonewton force detection has been demonstrated using silicon cantilevers at millikelvin temperatures [71]. When in static contact, the mean-square displacement of the cantilever tip caused by Brownian motion may be defined as [72]:…”

Section: Fundamental Limits To Resolutionmentioning

confidence: 99%

“…Assuming a noise density n ds in the displacement-sensing system, an additional term n 2 ds B À Á is added to the total noise displacement. From this, the minimum detectable force in static contact AFM as defined by the Brownian motion and sensor noise is computed assuming a linear spring, namely [72]:…”

Section: Fundamental Limits To Resolutionmentioning

confidence: 99%

See 2 more Smart Citations

The Potential of MEMS for Advancing Experiments and Modeling in Cell Mechanics

2007

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Response to mechanical stimuli largely dictates cellular form and function. A host of extraordinary yet unexplained responses have been identified within the hierarchical cell structure. As experimental and model-based investigations in cell mechanics advance, the underlying structure-function mechanisms dictating these responses emerge. Here we explore the potential of microelectromechanical systems (MEMS) for advancing understanding of cell mechanics. To motivate the discussion, existing experimental techniques are summarized. Interrelated model-based approaches, which aim to interpret or predict observed results, are also outlined. We then focus on a representative set of MEMS-based devices designed for investigations in cell mechanics and point to the fact that, while these devices have yet to maximize their functionality through higher levels of sensor/actuator integration, they are highly complementary to existing techniques. In closing, novel MEMS sensor and actuator schemes that have yet to materialize in this field are discussed to motivate the next generation of MEMS for investigations in cell mechanics.

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Section: Fundamental Limits To Resolutionmentioning

confidence: 98%

Section: Fundamental Limits To Resolutionmentioning

confidence: 99%

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The Potential of MEMS for Advancing Experiments and Modeling in Cell Mechanics

2007

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“…Так как согласно [21,22], добротность кантилевера в воздухе ~ в 10 раз меньше, чем в вакууме, то отсюда следует, что значения силы на порядок больше в воздухе, чем в вакууме при условии одинаковых амплитуд свободных и вынужденных колебаний.…”

Section: асм-определениеолигомерногосостоянияCyp102a1unclassified

Oligomeric state investigation of flavocytochrome CYP102A1 using afm with standard and supersharp probes

et al. 2013

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Atomic force microscopy with two types of probes – standard (radius of curvature R~10 nm) and supersharp (R~2 nm) – was used to determine CYP102A1oligomeric state. CYP102A1 images were obtained in a liquid, air and vacuum environment using the standard probes, also a ratio of monomers to oligomers (a) of CYP102A1 were determined as a=0.48:0.52. At the same time use of standard probes did not allow to resolve the structure of these oligomers. Supersharp probes allowed to obtain the data about the monomers to oligomers ratio, and also about the dimers/trimers/tetramers ratio in air and vacuum. So, a ratio a of CYP102A1 in liquid can be determined by the standard probes, and an oligomeric state of protein can be specified by the supersharp probes.

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“…where k is the spring constant, f is the resonance frequency, δf is the frequency noise, n ds is the deflection noise density, A is the amplitude, k B is the Boltzmann constant, T is the temperature, and B is the bandwidth. [8][9][10] The first, second, and third terms in Eq. ( 2) are ascribable to the thermal noise, displacement sensor noise, and oscillator noise, respectively.…”

mentioning

confidence: 99%

Two-step sharpening process for silicon probe in quartz-based atomic force microscopy sensor

Ichii¹,

Tagai²,

Omori³

et al. 2015

Jpn. J. Appl. Phys.

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A two-step sharpening process for a Si pillar in a quartz tuning fork sensor was developed for use in frequency modulation atomic force microscopy (FM-AFM). By combining electrochemical etching in HF solution and anisotropic etching in KOH solution, the tip radius was decreased to 120 nm. The Si-probe-attached sensor showed a higher resonance frequency than a tungsten-probe attached sensor, which would lead to a higher force sensitivity. We demonstrated FM-AFM imaging on a cleaved mica surface in aqueous solution by using the fabricated sensor, and atomic resolution was successfully achieved.

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Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments

Cited by 6 publications

References 62 publications

The Potential of MEMS for Advancing Experiments and Modeling in Cell Mechanics

The Potential of MEMS for Advancing Experiments and Modeling in Cell Mechanics

Oligomeric state investigation of flavocytochrome CYP102A1 using afm with standard and supersharp probes

Two-step sharpening process for silicon probe in quartz-based atomic force microscopy sensor

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