2015
DOI: 10.1364/oe.23.027975
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Dynamic intensity normalization using eigen flat fields in X-ray imaging

Abstract: In X-ray imaging, it is common practice to normalize the acquired projection data with averaged flat fields taken prior to the scan. Unfortunately, due to source instabilities, vibrating beamline components such as the monochromator, time varying detector properties, or other confounding factors, flat fields are often far from stationary, resulting in significant systematic errors in intensity normalization. In this work, a simple and efficient method is proposed to account for dynamically varying flat fields.… Show more

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Cited by 89 publications
(51 citation statements)
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“…They were normalized by flat field correction [53] to remove image artefacts. A denoising algorithm, VBM3D [54], was applied, followed by background subtraction and segmentation.…”
Section: Image Processing and Quantificationmentioning
confidence: 99%
“…They were normalized by flat field correction [53] to remove image artefacts. A denoising algorithm, VBM3D [54], was applied, followed by background subtraction and segmentation.…”
Section: Image Processing and Quantificationmentioning
confidence: 99%
“…The planar data are processed by a conventional darkcurrent subtraction and flat-field normalization, whereas for CT scans the projections are normalized using a dynamic flat-field approach based on principal-component analysis of the flat images to compensate for beamintensity variations over long exposures [37]. The normalized projections are (optionally) phase retrieved and reconstructed via a graphics-processing-unit-(GPU-)based filtered back projection with a standard Shepp-Logan filter [38].…”
Section: Data Processing and Reconstructionmentioning
confidence: 99%
“…Namely, given a 30 Hz frame rate and a window of 2w þ 1 = 11 frames, the gain should not vary significantly for times of the order of 1 s. In addition, the fluctuations of the beam are assumed to be small in the time scale of the acquisition: this requirement is generally fulfilled at the Elettra synchrotron operated in topup mode, where 1 mA of ring current is injected every 20 min, having a baseline of 140 mA at 2.4 GeV. A different approach to the dynamic flat-fielding based on principal component analysis is given by Van Nieuwenhove et al (2015). 2.3.2.…”
Section: Pre-processingmentioning
confidence: 99%