Dynamic nano-triboelectrification using torsional resonance mode atomic force microscopy

Abstract

Understanding the mechanism of charge generation, distribution, and transfer between surfaces is very important for energy harvesting applications based on triboelectric effect. Here, we demonstrate dynamic nanotriboelectrification with torsional resonance (TR) mode atomic force microscopy (AFM). Experiments on rubbing the sample surface using TR mode for the generation of triboelectric charges and in-situ characterization of the charge distribution using scanning Kelvin probe microcopy (SKPM) were performed. This method allows the tip to perform lateral oscillation and maintains the tip-sample interaction in the attractive region to ensure high efficiency of the charge generation during the rubbing process. The measured efficiency of generating triboelectric charges can achieve ~10.53 times higher than conventional static/contact mode in the triboelectrification experiments. In addition to the charge generation, local discharging experiments were also performed. This work would provide a new method to generate patterned charges and also be helpful in understanding the mechanism of nanotriboelectrification.

Non-contact lateral force microscopy

“…Krass, Gosvami, Carpick, Müser and Bennewitz investigated hexadecane, used as a model for lubricants, on graphite [47]. More recently, Cai and Yao used dynamic LFM to controllably rub a sample and produce a local triboelectric charge [13].…”

Investigation on battery-less voltage of piezoelectric V-shape cantilever beam energy harvester using FEA method for pacemaker

“…By incorporating a piezoelectric material into the cantilever beam structure, mechanical vibrations or movements can be converted into electric energy through the piezoelectric effect. This concept offers a practical method to capture and convert ambient mechanical energy, such as human movement or machinery vibrations, into usable electrical power [19][20][21][22][23][24][25]. Investigated the effects of geometrical dimensions, such as cantilever length, top width, bottom width, and thickness, on the static and dynamic parameters, higher bending modes vibrations and multifrequency characteristics of V-shape cantilevers, using Atomic-Force-Microscopy (AFM) measurements [26,27].…”

Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach

“…Unfortunately, doing so leaves quantitative models for the origin of surface charge heterogeneity untestable [6]. In some cases [16][17][18], the charged surface and ground plane are thought of as a capacitor, and the KPFM signal is presumed to be the voltage across this, but this intuitive approach has no rigorous physical backing and cannot be expected at all to work for small charge features. Analytical approaches to convert voltage to charge have relied on aggressive simplifications, e.g., approximating the entire micron-scale AFM probe/cantilever by a nanoscale sphere [9,11].…”