Dynamic out-of-plane deformation measurement using virtual speckle patterns

Arai, Yasuhiko; Shimamura, R.; Yokozeki, Shunsuke

doi:10.1016/j.optlaseng.2008.10.010

Cited by 19 publications

(13 citation statements)

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“…A specklegram is generally calculated as a fringe image concerning the deformation of the measured object. 6,9,10,18 Then, the measured deformation, which is treated in this paper, is illustrated as the specklegram shown in Fig. 2(c), and the deformation is an out-of-plane deformation.…”

Section: Three Kinds Of Information Distribution Inmentioning

confidence: 99%

“…7,8 Successively, a high-resolution power measurement method based on the temporal carrier technology was also developed by extending this technology as two-dimensional (2-D) analysis using virtual speckle patterns. 9 Recently, the demand of such a dynamic and high-resolution measurement in industrial fields has increased. In particular, the measurement of an object with rough surfaces is required.…”

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confidence: 99%

“…In this method, a high-resolution fringe analysis can be performed by using the skilled filtering technology in fringe analyzing process. 9,10 Then, one sheet of specklegram is calculated by using two sheets of speckle patterns grabbed before and after the deformation. 6 That is, at least two speckle patterns are required for producing one sheet of specklegram.…”

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confidence: 99%

“…the other hand, a high-resolution fringe analysis can be performed by using the skilled filtering technology for fringe analyzing process in the latter method. 9,10 In this paper, the latter method, which can perform a high-resolution analysis by using filtering technology, 18,19 is employed. Here, it is assumed that the intensity of speckle patterns (S 0 ; S 1 ) before and after the deformation are generally given as shown in Eqs.…”

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Arai

2014

Opt. Eng

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Abstract. High-resolution deformation measurement method, which requires only two speckle patterns in electronic speckle pattern interferometry, is proposed by using fringe analysis based on specklegram. In fringe analysis using the proposed optical system, a pair of real-and imaginary-part components concerning the deformation information is extracted from one speckle pattern by Fourier transform in the same manner as the off-axis digital holography processing. A specklegram is calculated as a fringe image by multiplying the components of the real and imaginary part of speckle patterns in order to perform a high-resolution deformation analysis. Then, the phase map concerning deformation is detected from the specklegram, and the influence of speckle noise is also reduced by shifting the component on frequency domain. Furthermore, the amplitude of the intensity distribution of speckle pattern is normalized in order to reduce the influence by speckle noise much more. It is confirmed that the accuracy of the deformation measurement is efficiently improved by the proposed noise reduction methods. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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Section: Three Kinds Of Information Distribution Inmentioning

confidence: 99%

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confidence: 99%

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confidence: 99%

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confidence: 99%

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Arai

2014

Opt. Eng

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“…In general, triangulation methods such as speckle projection [1] and fringe projection [2,3] provide large and flexible measurement ranges depending on the hardware setup. However, interferometric methods including holographic interferometry [4,5], shearography [6][7][8], speckle interferometry [9][10][11], and moiré interferometry [12,13] are more suitable for microscale and nanoscale measurements since they provide considerably higher accuracy.…”

Section: Introductionmentioning

confidence: 99%

Out-of-plane displacement field measurement by shearography

Bai

Zhu

2015

Optics & Laser Technology

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Advances in Speckle Metrology

Joenathan

Sirohi

Bernal

2015

The Optics Encyclopedia

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The field of speckle metrology has seen a surge in development in the past 10 years owing to advancements in digital cameras and computing power. For instance, a variety of digital speckle correlation (DSC) processes can now be performed in almost real time and therefore speckle techniques has found applications in nondestructive testing (NDT), biology, and medicine. New techniques in terms of optical arrangements and in extracting phase data have been introduced for measuring out‐of‐plane and in‐plane motions in digital speckle interferometry (DSPI) and digital speckle shear interferometry (DSSPI). DSC, DSPI, and DSSPI have also been combined to extend the range of measurements. In addition, quantitative analysis in speckle interferometry has seen a plethora of new software developments for conducting real‐time, accurate, complicated, fast, and repeatable measurements with ease. In addition, different methods to process speckle fringes have made analysis equivalent to that of classical interferometry, yet can be applied to all types of real‐world specimen.

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Dynamic out-of-plane deformation measurement using virtual speckle patterns

Cited by 19 publications

References 18 publications

Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Out-of-plane displacement field measurement by shearography

Advances in Speckle Metrology

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