2009
DOI: 10.1016/j.optlaseng.2008.05.016
|View full text |Cite
|
Sign up to set email alerts
|

Dynamic out-of-plane profilometry for nano-scale full-field characterization of MEMS using stroboscopic interferometry with novel signal deconvolution algorithm

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
21
0

Year Published

2010
2010
2020
2020

Publication Types

Select...
3
3
2

Relationship

0
8

Authors

Journals

citations
Cited by 28 publications
(21 citation statements)
references
References 8 publications
0
21
0
Order By: Relevance
“…Therefore the shortest pulse created by the combined source is limited to 18.8 ns. This is shorter than the shortest pulses created by phosphor based LEDs [2,10]. The maximum frequency of stroboscopic measurements using 10 % duty cycle is 5.4 MHz.…”
Section: Pulsingmentioning
confidence: 83%
See 2 more Smart Citations
“…Therefore the shortest pulse created by the combined source is limited to 18.8 ns. This is shorter than the shortest pulses created by phosphor based LEDs [2,10]. The maximum frequency of stroboscopic measurements using 10 % duty cycle is 5.4 MHz.…”
Section: Pulsingmentioning
confidence: 83%
“…LEDs are replacing halogen lamps as light sources for scanning white light interferometers (SWLI) because they are compact, produce little heat, have long lifetime over which their spectrum does not change, and they can be pulsed allowing stroboscopic illumination without choppers or other additional moving devices [1][2][3]. In most applications phosphor-based white LEDs are favored because they feature a short coherence length and broad spectrum [1].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Scanning laser interferometry [6][7][8][9], capable of detecting (sub)picometer vibration amplitudes, has dominated the characterization of high-frequency electromechanical devices, for which the typical maximum amplitudes are below 1 nm and the operation frequencies can extend up to several GHz. The widespread use of silicon-based MEMS resonators with their typical operation frequencies ranging from sub-kHz to several tens of MHz and with their maximum out-of-plane vibration amplitudes of even up to several micrometers has raised an interest in utilizing stroboscopic white-light interferometry (SWLI) for device characterization [10][11][12]. The SWLI technique is particularly interesting as it readily enables unambiguous detection of vibrations with amplitudes greater than the fringe period of the interferometric signal.…”
Section: Introductionmentioning
confidence: 99%
“…Dynamic 3D shape measurement as seen from current literature is mainly limited to measurement of diffuse objects. Su and Zhang review the development of dynamic 3D shape measurement in recent years [123,124,[150][151][152][153]. Zhang [23,28] proposed a real-time 3D shape measurement system with phase shifted digital fringe projection technique for diffuse objects, which utilizes a color wheel-removed digital light processing projector as the structured light source and accelerates the processing by a graphics processing unit.…”
Section: Fast Frd and Its Application In Dynamic 3d Sensing Of Speculmentioning
confidence: 99%