2015
DOI: 10.5573/jsts.2015.15.6.685
|View full text |Cite
|
Sign up to set email alerts
|

Dynamic Reference Scheme with Improved Read Voltage Margin for Compensating Cell-position and Background-pattern Dependencies in Pure Memristor Array

Abstract: Abstract-In this paper, a new dynamic reference scheme is proposed to improve the read voltage margin better than the previous static reference scheme. The proposed dynamic reference scheme can be helpful in compensating not only the background pattern dependence but also the cell position dependence. The proposed dynamic reference is verified by simulating the CMOS-memristor hybrid circuit using the practical CMOS SPICE and memristor Verilog-A models. In the simulation, the percentage read voltage margin is c… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
12
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
6

Relationship

2
4

Authors

Journals

citations
Cited by 7 publications
(12 citation statements)
references
References 17 publications
(22 reference statements)
0
12
0
Order By: Relevance
“…However, the impact wire resistance in crossbar is inevitable. It becomes more serious as the array size increases [25]. Wire resistance is modeled by small-value resistors lying on the vertical lines and the horizontal lines, as shown in Figure 3.…”
Section: Methodsmentioning
confidence: 99%
See 4 more Smart Citations
“…However, the impact wire resistance in crossbar is inevitable. It becomes more serious as the array size increases [25]. Wire resistance is modeled by small-value resistors lying on the vertical lines and the horizontal lines, as shown in Figure 3.…”
Section: Methodsmentioning
confidence: 99%
“…In a memristor crossbar array, some amount of voltage drop can be caused by parasitic resistance, also known as wire resistance along the row and the column lines [19,[24][25][26][27][28]. Hereinafter "wire resistance" and "parasitic resistance" are used interchangeably.…”
Section: Introductionmentioning
confidence: 99%
See 3 more Smart Citations