2018
DOI: 10.1021/acs.nanolett.8b00171
|View full text |Cite
|
Sign up to set email alerts
|

Dynamic Tunneling Junctions at the Atomic Intersection of Two Twisted Graphene Edges

Abstract: The investigation of the transport properties of single molecules by flowing tunneling currents across extremely narrow gaps is relevant for challenges as diverse as the development of molecular electronics and sequencing of DNA. The achievement of well-defined electrode architectures remains a technical challenge, especially due to the necessity of high precision fabrication processes and the chemical instability of most bulk metals. Here, we illustrate a continuously adjustable tunneling junction between the… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
18
1

Year Published

2018
2018
2022
2022

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 17 publications
(20 citation statements)
references
References 39 publications
1
18
1
Order By: Relevance
“…The current, I , between flakes is assumed to depend exponentially on the distance, d , according to IAeVexpαd+dVdW where V is the potential difference between overlapping flakes on adjacent layers, A is the areal overlap of the flakes, α is the tunneling constant, and we offset the distance between flakes, d , by the van der Waals distance, d VdW = 0.335 nm. [ 42,43 ] We note, that the proportionality constant in Equation (1) could be temperature dependent hence representative of hopping transport. Equation (1) is derived using the Landauer–Büttiker formula [ 44 ] with a tunneling probability found via the Wentzel–Kramers–Brillouin (WKB) approximation.…”
Section: Resultsmentioning
confidence: 99%
“…The current, I , between flakes is assumed to depend exponentially on the distance, d , according to IAeVexpαd+dVdW where V is the potential difference between overlapping flakes on adjacent layers, A is the areal overlap of the flakes, α is the tunneling constant, and we offset the distance between flakes, d , by the van der Waals distance, d VdW = 0.335 nm. [ 42,43 ] We note, that the proportionality constant in Equation (1) could be temperature dependent hence representative of hopping transport. Equation (1) is derived using the Landauer–Büttiker formula [ 44 ] with a tunneling probability found via the Wentzel–Kramers–Brillouin (WKB) approximation.…”
Section: Resultsmentioning
confidence: 99%
“…Methods have therefore been developed to fabricate MCBJ junctions that can be used to study molecular transport in a solvent by coating the metal electrode with a thin insulating oxide layer 24,25 . In this respect, graphene is an promising electrode option, and the first graphene-based MCBJs have been fabricated 26,27 .…”
Section: [H1] Introductionmentioning
confidence: 99%
“…From this fit, we obtain a distance of 1.12 nm (±8%) and an effective work function j1=2.8 eV (±10%) for 4-layer sample, and 0.98 nm (±8%), j2=2.8 eV (±10%) for 3-layer sample. The work function is significantly lower than the values obtained by Kelvin probe microscopy on the face of Bp sheets (5.35 to 5.42 eV) and graphene sheets (4.45 to 4.8 eV) [27]. Figure 5(d) shows the response time spectrum of the sample.…”
Section: Resultsmentioning
confidence: 75%