Proceedings of the 2014 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays 2014
DOI: 10.1145/2554688.2554784
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Dynamic voltage & frequency scaling with online slack measurement

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Cited by 38 publications
(28 citation statements)
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“…In this paper, the framework is extended with new tools and IP components to support the latest generation Zynq Ultrascale devices fabricated in 16 nm and a comparison is performed with the older 28 nm devices in terms of energy adaptivity and performance for the BNN application. Related to this research is the FPGA-focused voltage and frequency scaling work done in [19] which uses an online slack measurement (OSM) technique. The OSM method uses direct timing measurement of the application circuit to respond to variation, temperature, and degradation.…”
Section: Adaptive Voltage and Frequency Scalingmentioning
confidence: 99%
“…In this paper, the framework is extended with new tools and IP components to support the latest generation Zynq Ultrascale devices fabricated in 16 nm and a comparison is performed with the older 28 nm devices in terms of energy adaptivity and performance for the BNN application. Related to this research is the FPGA-focused voltage and frequency scaling work done in [19] which uses an online slack measurement (OSM) technique. The OSM method uses direct timing measurement of the application circuit to respond to variation, temperature, and degradation.…”
Section: Adaptive Voltage and Frequency Scalingmentioning
confidence: 99%
“…However, the inaccuracy of path monitor circuitries in FPGAs and even ASICs has been well elaborated [24], [25], [26], [27]. Levine et al employ timing error detectors inserted as capture registers with a phase-shifted clock at the end of critical paths to find out the timing slack of FPGA-mapped designs through a gradual reduction of voltage [24]. Their approach adds extra area and power overhead, cannot be implemented in paths heading to hard blocks such as memories, and assumes the corresponding paths will be exercised at runtime.…”
Section: Related Workmentioning
confidence: 99%
“…Thus d worst is the target delay that our algorithm attempts to deliver with lower voltages. One drawback of previous voltage scaling approaches [14], [16] is they invade this reliability margin when they speculatively reduce the voltage until observing an error in the output, as the error does not show up in regular conditions. The core of the algorithm is a loop where, based on previously obtained temperature for each tile (set to T amb initially), it finds the (V core , V bram ) pair that minimizes the power while watches over the delay of candidate pair to not exceed d worst .…”
Section: B Proposed Thermal-aware Voltage Scaling Flowmentioning
confidence: 99%