2020
DOI: 10.1016/j.micpro.2019.102963
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DYSCO: DYnamic Stepper Current InjectOr to improve write performance in STT-RAM memories

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Cited by 7 publications
(1 citation statement)
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“…However, both of these solutions incur unnecessary power overhead in the circuit. There are different state-of-the-art techniques [16]- [21] addressing the write operation of STT-RAM across different levels of system abstractions, i.e., at device, circuit, architecture, and the application level. However, the currently proposed methods ignored the importance of reliability caused by radiation-induced soft errors.…”
Section: Introductionmentioning
confidence: 99%
“…However, both of these solutions incur unnecessary power overhead in the circuit. There are different state-of-the-art techniques [16]- [21] addressing the write operation of STT-RAM across different levels of system abstractions, i.e., at device, circuit, architecture, and the application level. However, the currently proposed methods ignored the importance of reliability caused by radiation-induced soft errors.…”
Section: Introductionmentioning
confidence: 99%