Electron Backscatter Diffraction in Materials Science 2009
DOI: 10.1007/978-0-387-88136-2_26
|View full text |Cite
|
Sign up to set email alerts
|

EBSD in the Earth Sciences: Applications, Common Practice, and Challenges

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
103
0
1

Year Published

2014
2014
2022
2022

Publication Types

Select...
6
1
1

Relationship

1
7

Authors

Journals

citations
Cited by 115 publications
(105 citation statements)
references
References 83 publications
1
103
0
1
Order By: Relevance
“…They are locally imbricated, confirming the top-to-the-SE kinematics. Locally the mylonitic fabric is deformed by a pervasive extensional crenulation cleavage (ECC; Platt and Vissers, 1980) with individual shear bands dipping gently towards the NNW invariably indicating top-to-the-SE transport, which, in the present geometry, corresponds to southeastward thrusting along the NFZ ( Fig. 2a and b).…”
Section: Nussirjávri Fault Zonementioning
confidence: 72%
See 2 more Smart Citations
“…They are locally imbricated, confirming the top-to-the-SE kinematics. Locally the mylonitic fabric is deformed by a pervasive extensional crenulation cleavage (ECC; Platt and Vissers, 1980) with individual shear bands dipping gently towards the NNW invariably indicating top-to-the-SE transport, which, in the present geometry, corresponds to southeastward thrusting along the NFZ ( Fig. 2a and b).…”
Section: Nussirjávri Fault Zonementioning
confidence: 72%
“…To remove surface damage and thereby enhance the diffraction signal, the thin sections were polished using colloidal silica for 5 min (Moen et al, 2003) and placed in a Hitachi VP-SEM with a Nordif UF-1000 EBSD detector (Chen et al, 2012) at a 70 • tilt to the horizontal (Prior et al, 1999). To acquire satisfactory pattern quality the accelerating voltage used was 20.0 kV at 35 nA absorbed current.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…In such cases, concrete identification of mineral phases has conventionally relied on complementary analytic techniques including X-ray diffraction (XRD), TEM and various transmission-mode X-ray spectroscopies, which although powerful, demand either sample volumes of many cubic microns or thin slices excised from the bulk sample at the cost of man-hours and destroying the nearby sample. Even the electron backscatter diffraction technique, a powerful highresolution probe of crystal structure (insensitive to glassy structure), requires careful deposition of a conductor over insulating minerals 42 . In stark contrast, nanoFTIR measurements are fundamentally non-destructive, requiring no special sample preparation beyond a surface polish with micron-scale smoothness, which even then might be omitted for smooth or terraced sample regions.…”
Section: Resultsmentioning
confidence: 99%
“…
Electron Backscattered Diffraction (EBSD) has become widely accepted for the crystallographic microstructural characterization of geological materials [1]. For comprehensive multi-phase material analysis, correlating the EBSD structural data with complementary compositional information from analytical techniques including Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and Cathodoluminescence (CL) can improve EBSD phase differentiation performance and provides a more complete description of each analyzed phase.

When an EDS detector is properly positioned relative to a highly-tilted EBSD sample, EDS data can be collected simultaneously with the EBSD data.

…”
mentioning
confidence: 99%