1994
DOI: 10.1103/physrevb.49.10778
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Edge-magnetoplasma excitations in GaAs-AlxGa1

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Cited by 11 publications
(4 citation statements)
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“…In the study of dynamic magnetotransport behaviors of low-dimensional electron systems (LDESs), such as two-dimensional electron systems (2DESs), 1,2,3,4,5 quantum wires (QWs) 6 , and anti quantum dots (QDs), 7 a microwave vector detection system, which can measure both the amplitude and the phase variations of the signals under the influence of the LDESs in magnetic fields, is indispensable. Usually people use a conventional vector network analyzer (VNA) as such a detection system by virtues of its expediency and broadband characteristics.…”
Section: Introductionmentioning
confidence: 99%
“…In the study of dynamic magnetotransport behaviors of low-dimensional electron systems (LDESs), such as two-dimensional electron systems (2DESs), 1,2,3,4,5 quantum wires (QWs) 6 , and anti quantum dots (QDs), 7 a microwave vector detection system, which can measure both the amplitude and the phase variations of the signals under the influence of the LDESs in magnetic fields, is indispensable. Usually people use a conventional vector network analyzer (VNA) as such a detection system by virtues of its expediency and broadband characteristics.…”
Section: Introductionmentioning
confidence: 99%
“…In Fig. 2 (c this feature relates to the edge magnetoplasma 12 (EMP) excitations. More detailed data and explanation of these interesting results will be published separately.…”
mentioning
confidence: 99%
“…In the last few years, considerable progress has been made in the field of semiconductor quantum wires and quantum dots. [1][2][3] Quantum confinement effects have been observed in wires and dots with a size up to about 2000 Å. 1,2 High resolution x-ray diffractometry provides a promising method for structural investigations of periodic arrays of semiconductor surface corrugations, 4 -7 quantum wires, 8,9 and quantum boxes.…”
mentioning
confidence: 99%
“…[1][2][3] Quantum confinement effects have been observed in wires and dots with a size up to about 2000 Å. 1,2 High resolution x-ray diffractometry provides a promising method for structural investigations of periodic arrays of semiconductor surface corrugations, 4 -7 quantum wires, 8,9 and quantum boxes. 9,10 It is nondestructive, averaging over a large area of the sample, and requires no sample pretreatment.…”
mentioning
confidence: 99%