“…In situ TEM tests provide an ideal tool for studying the actual deformation mechanisms involving the dislocation activities of NWs under tension/compression. In fact, in situ TEM techniques have now become the most widely used method for characterizing a range of NWs, such as Si,101, 102 GaAs103, 104, 105, 106 ZnO,107, 108 VO 2 109. GaN,99, 110, 111 ZnTe,112 Ag,113, 114, 115, 116, 117 Ni118, 119 Cu,120, 121, 122 and metallic glasses 123, 124…”