2015
DOI: 10.1016/j.egypro.2015.07.098
|View full text |Cite
|
Sign up to set email alerts
|

Effect of Al Concentration Analyzed by ICP-OES on the Structural, Electrical and Optical Properties of Co-sputtered ZnO:Al Films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

1
1
0

Year Published

2016
2016
2021
2021

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 6 publications
1
1
0
Order By: Relevance
“…Table 2 shows the ICP-MS results of pure ZnO and Cr doped ZnO NPs. As shown in Table 2, there is a very good agreement among the expected chromium percentage using stoichiometry and the actual measured chromium concentration incorporated in the ZnO nanostructures [55].…”
Section: Dopant Concentration Analysissupporting
confidence: 53%
“…Table 2 shows the ICP-MS results of pure ZnO and Cr doped ZnO NPs. As shown in Table 2, there is a very good agreement among the expected chromium percentage using stoichiometry and the actual measured chromium concentration incorporated in the ZnO nanostructures [55].…”
Section: Dopant Concentration Analysissupporting
confidence: 53%
“…Prior to Hall effect measurements a UV‐Vis‐NIR spectrophotometer (Agilent Cary 500) was used to carry out normal incident transmission measurements on the ZnO thin films. ICP‐AES (Thermo iCAP 6300) was used to quantitatively determine group III impurity concentrations within the thin films . For this thin films, grown under the same conditions as those for optical transmittance and Hall effect measurements, were dissolved into a 2% HNO 3­ solution.…”
Section: Methodsmentioning
confidence: 99%