2014
DOI: 10.1007/s13391-014-4007-8
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Effect of annealing on lattice strain and near-band-edge emission of ZnO nanorods

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Cited by 2 publications
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“…The lattice constant ( c ), crystallite size ( D ), stress (σ), and strain (ε) were calculated using the following relations (eq –) and are listed in Table . Here, λ, θ, β, d, and c o are X-ray wavelength of Cu Kα radiation (1.5406 Å), Bragg’s diffraction angle, full width at half-maxima (fwhm), interplanar spacing, and lattice constant of unstrained bulk ZnO (5.2066 Å), respectively. The observed peak shifts toward lower and higher angles revealed the variation in the lattice constant c . The average crystallite size of the deposited thin film was found to be increased from the R2 to R5 samples.…”
Section: Resultsmentioning
confidence: 89%
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“…The lattice constant ( c ), crystallite size ( D ), stress (σ), and strain (ε) were calculated using the following relations (eq –) and are listed in Table . Here, λ, θ, β, d, and c o are X-ray wavelength of Cu Kα radiation (1.5406 Å), Bragg’s diffraction angle, full width at half-maxima (fwhm), interplanar spacing, and lattice constant of unstrained bulk ZnO (5.2066 Å), respectively. The observed peak shifts toward lower and higher angles revealed the variation in the lattice constant c . The average crystallite size of the deposited thin film was found to be increased from the R2 to R5 samples.…”
Section: Resultsmentioning
confidence: 89%
“…The noticeable wavelike patterns (interference fringes) in the visible region might be due to the homogeneous surface 50,51 and coherence of incident and reflected waves. 49 This phenomena was commonly observed in the thin films deposited using sputtering, pulsed laser deposition, 50 and metal−organic chemical-vapor deposition 51 techniques. Even though the film showed a highly oriented growth along the c-axis, the observed variations in lattice parameters, thickness, and nanostructured morphology caused the changes in the absorbing wave patterns (Figure 4b).…”
Section: Methodsmentioning
confidence: 80%
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