2009
DOI: 10.1016/j.jallcom.2008.02.061
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Effect of annealing on structural and optical properties of zinc oxide thin film deposited by successive ionic layer adsorption and reaction technique

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Cited by 77 publications
(45 citation statements)
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“…Annealing-induced shifts of the absorption edge energies to lower energies may occur due to the localization of charges in individual nanocrystals and may be attributed to the grain size-dependent properties of the band gap energy. Similar red shifts in band gap energy values for the films with smaller thickness and/ or grain sizes have been reported for chemically deposited thin films [21]. Also, after aging, slight increases are observed at the band gap energies of the samples.…”
Section: Resultssupporting
confidence: 83%
“…Annealing-induced shifts of the absorption edge energies to lower energies may occur due to the localization of charges in individual nanocrystals and may be attributed to the grain size-dependent properties of the band gap energy. Similar red shifts in band gap energy values for the films with smaller thickness and/ or grain sizes have been reported for chemically deposited thin films [21]. Also, after aging, slight increases are observed at the band gap energies of the samples.…”
Section: Resultssupporting
confidence: 83%
“…Similar increase of luminescence intensity for the films annealed at higher temperature was reported by Vinodkumar et al for undoped ZnO films prepared by pulsed laser ablation [2]. The intensity ratio between the blue peak (446 nm) and green peak (527 nm) increases from 3.1 to 5.7 after annealing at 800 • C, indicating that the crystal quality of the films can be improved by annealing [35]. The intense PL emission of the films annealed at 800 • C suggests the possibility of the films for application as blue light emitter.…”
Section: Pl Propertiessupporting
confidence: 85%
“…Additionally, Cao et al reported that the emission at the same wavelength (525 nm) is known to be a deep level emission which is caused by impurities of structural defects in the crystal, such as oxygen vacancies, and zinc interstitials [71][72][73]. This is a result of intrinsic defects within zinc oxide semiconductor nanoparticles [74,75].…”
Section: Methodsmentioning
confidence: 99%