The VLSI industry is facing the significant parasitic effects that creates a serious problem for further development in the nanoscale domain. However, instead of replacing the traditional MOSFET design, it would be more advantageous to apply different doping profiles for ultra-low power applications. With a comprehensive review of Gaussian doping, Uniform doping, and Delta doping profiles and analysis of the FET technology characteristics that use these doping profiles, a comparison can be made among them for integrated circuit design engineers. These doping profiles are compared based on how well they perform between non-ideal and ideal environments. Also, both digital and analog performance parameters are measured to ensure the uniqueness of each doping profile. After getting a list of benefits from each doping profile that is presented in this paper, it is concluded to determine which doping profile works best against a host of parasitic effects. Finally, this paper also conclude that what type of possible applications do these doping profiles.