2017
DOI: 10.1088/1361-6439/aa8917
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Effect of deposition parameters on surface roughness and consequent electromagnetic performance of capacitive RF MEMS switches: a review

Abstract: Surface roughness seriously affects the electromagnetic performance of capacitive radio frequency (RF) micro-electromechanical system (MEMS) switches. This review presents the effects of different film thickness values, substrate topologies, sputtering powers, gas pressures, gas ratios, substrate temperatures and annealing temperatures on the surface roughness of deposited thin films. At the same time, the mechanisms of the deposition parameters on the surface roughness are also analyzed. The effects of surfac… Show more

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Cited by 29 publications
(10 citation statements)
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“…For the present analysis, the roughness of the thin film is considered as the main observable of interest because it is susceptible to noise and it must be below a threshold for the thin film's electrical conductivity to be acceptable (Chen et al 2017;Ketenoğlu and Ünal 2013;G. Palasantzas and Barnaś 1997;George Palasantzas 1998).…”
Section: Microscale Kinetic Monte Carlo Modelmentioning
confidence: 99%
“…For the present analysis, the roughness of the thin film is considered as the main observable of interest because it is susceptible to noise and it must be below a threshold for the thin film's electrical conductivity to be acceptable (Chen et al 2017;Ketenoğlu and Ünal 2013;G. Palasantzas and Barnaś 1997;George Palasantzas 1998).…”
Section: Microscale Kinetic Monte Carlo Modelmentioning
confidence: 99%
“…It seems that higher RF power enhanced mobility energy of Al sputtered atoms on the surface of the substrate to diffuse in the substrate during growth stage and formed a new phase of aluminum silicone oxide. In other word, higher sputtering power induced high incident ion energy, resulting in high surface mobility and mean diffusion path of sputtered atoms [26]. In addition, X-ray diffraction pattern, Fig.…”
Section: X-ray Diffraction Analysis (Xrd)mentioning
confidence: 98%
“…Increasing the intensity of diffraction peaks by increasing the RF power confirms a better crystallinity of the samples at higher RF powers. By increasing the sputtering power, the sputtering yield becomes high and the sputtered particles are ejected with higher energy and the growth of a more crystallized phase [26]. It seems that the peak at 2θ = 61.6° is the preferred crystalline orientation in higher RF power and is so strong in 300 W.…”
Section: X-ray Diffraction Analysis (Xrd)mentioning
confidence: 99%
“…NEM switch actuation can be done using different methods like electrostatic [24] [25], thermal [26], piezoelectric [27] and magnetic [28]. But electrostatic actuation is the most favourable actuation mechanism as it requires low power consumption, small electrode size and low switching time.…”
Section: Introductionmentioning
confidence: 99%